Mean Reflectivity of Dielectric Materials in Reverberation Chambers vs Free Space Conditions

Novel materials with diverse mechanical and electrical features are increasingly used to meet market demands for sustainability, design flexibility, and cost-effectiveness. The unknown electromagnetic performance of these materials poses challenges from the electromagnetic compatibility standpoint, making it difficult to estimate their effectiveness. Additionally, there are insufficient methods to compare more frequently used techniques for material characterization, such as the free space methods and those based on reverberation chamber measurements. This gap makes it hard to contrast both properly. As a preliminary step, this paper theoretically calculates the mean reflectivity in far-field and reverberation chamber conditions. The outcomes indicate that both methods provide comparable mean reflectivity. Such results confirm the validity of the considered techniques.