Exploring the Effects of Time Constants on Short Pulse Testing in Electromagnetic Reverberation Chambers

We have performed pulsed tests on a reference test setup inside two different reverberation chambers. One chamber has a time constant $\tau=1.5 \mu \mathrm{~s}$ while the other has $\tau=0.13 \mu s$. Failure thresholds of error functions are then measured and compared for the different chambers. We find that the failure thresholds are on average lower inside the reverberation chamber with $\tau=0.13 \mu s$. The lower average failure thresholds are concluded to most likely be due to a faster rise time and longer time at steady-state amplitudes of the electric fields, both being an effect of the lower time constants.