Characterization of Current Probes Using TRL Self-Calibration and Multiport Error Correction

In this paper, a calibration method for the characterization of current probes is proposed. For this purpose, the well-known TRL self-calibration procedure is used to characterize the calibration setup. Subsequently, de-normalization of the determined error networks is performed, which enables a 3-port error correction. The method is validated in a coaxial system and the measurement results are compared with a direct measurement of the device under test. Magnitude and phase deviations of less than 0.5 dB and 0.6°, respectively, are obtained in the frequency range from 10 MHz to 3.5 GHz. Furthermore, a current probe was characterized in the frequency range from 10 kHz to 1 GHz to demonstrate the proposed measurement method.

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Publication Details

Published
2024-09-02
DOI
https://doi.org/10.1109/emceurope59828.2024.10722470
Citations
2
Primary Topic
Integrated Circuits and Semiconductor Failure Analysis
Type
article
Field-Weighted Citation Impact
0.42
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article

Characterization of Current Probes Using TRL Self-Calibration and Multiport Error Correction

R. Stollé, Sören Kohnert, Manuel Mikschl
2 citations
Integrated Circuits and Semiconductor Failure Analysis
0.42
article

Characterization of Current Probes Using TRL Self-Calibration and Multiport Error Correction

R. Stollé, Sören Kohnert, Manuel Mikschl
article en
2 citations

Abstract

In this paper, a calibration method for the characterization of current probes is proposed. For this purpose, the well-known TRL self-calibration procedure is used to characterize the calibration setup. Subsequently, de-normalization of the determined error networks is performed, which enables a 3-port error correction. The method is validated in a coaxial system and the measurement results are compared with a direct measurement of the device under test. Magnitude and phase deviations of less than 0.5 dB and 0.6°, respectively, are obtained in the frequency range from 10 MHz to 3.5 GHz. Furthermore, a current probe was characterized in the frequency range from 10 kHz to 1 GHz to demonstrate the proposed measurement method.

Technische Hochschule Augsburg (DE)
Openalex Percentile: Top 37%
Integrated Circuits and Semiconductor Failure Analysis
0.42
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