Low Self-Distortion Test Fixture for Contact Harmonic and Passive Intermodulation Measurement

Interference, as caused by metal-metal contact induced harmonic and passive intermodulation distortion, presents a significant challenge to the mobile device industry. Though previous efforts have established a solid foundation for the systematic study of contact harmonics, the test fixtures used have proven to be a source of significant measurement uncertainty. Specifically, the mechanical instability associated with compressing the sample-holder PCBs causes issues in signal and force measurement. We propose a rigid, horizontally mounted test fixture, reducing excessive degrees of freedom and effectively eliminating the uncertainties from sample mounting and positioning seen in other geometries.