Modeling the ESD Dynamic Behavior of TVS Based on a Time-dependent Resistance

The traditional SPICE diode model does not fully characterize the response of transient voltage suppressor (TVS) under transient electrostatic discharge (ESD) pulses. This paper introduces a dynamic behavior model of the TVS diode under transient voltage, based on a time-dependent resistance model. Drawing on the similarity assumption that the avalanche breakdown behavior between the diode and the gas spark-gap device share physical mechanisms, the time-dependent arc resistance model of gas breakdown is utilized to describe the transient response behavior of TVS devices. Additionally, an extra series resistance is adopted to modify the arc resistance model, ensuring it matches the transient response curve. Consequently, consistency between simulation and measurement is achieved under transmission line pulse (TLP) pulses of varying voltage levels, verifying the accuracy of the model under ESD generator excitation.