Evaluation of Simulated and Real Measurement Data for AI-based Interference Classification in EMC Applications
This paper aims to compare real-world and simulated measurement data of printed circuit boards (PCBs) and identify relationships between input and output classes. The data is evaluated using dimensionality reduction techniques and feature-to-output correlation metrics. This analysis aims to provide insights into the accuracy and reliability of simulated data in representing real-world PCB measurements. The goal is to enhance simulation accuracy and reliability in PCB design and manufacturing processes.
Authors
- Marcel Olbrich
- Dennis Hemker
- Sven Lange (ORCID: https://orcid.org/0000-0002-5471-6616)
- Harald Mathis
- Christian Hedayat
- Jad Maalouly
- Jürgen Kutter
Institutions
- Fraunhofer Institute for Applied Information Technology (DE)
- Fraunhofer Institute for Electronic Nano Systems (DE)
- EMC Microcollections (Germany) (DE)
Publication Details
- Published
- 2024-09-02
- DOI
- https://doi.org/10.1109/emceurope59828.2024.10722094
- Citations
- 3
- Primary Topic
- Electromagnetic Compatibility and Measurements
- Type
- article
- Field-Weighted Citation Impact
- 0.63