S-Parameters Characterization for EMI Filters: Limitations
This paper describes the S-parameters measurement techniques for electromagnetic interference filter performance evaluation using single-ended to mixed-mode conversion and pure-mode approaches In conjunction with an SDR-based vector network analyzer, it investigates the feasibility and accuracy of these techniques. Experimental results from testing commercial off-the-shelf filters and custom-made notch filters are presented, demonstrating the capabilities and limitations of used measurement techniques, and highlighting the influence of VNA parameters on measurement accuracy and the trade-off between speed and precision of the measurement results.
Authors
- Niek Moonen (ORCID: https://orcid.org/0000-0002-7399-673X)
- Daria Nemashkalo (ORCID: https://orcid.org/0000-0002-0068-4110)
- Patrick Koch (ORCID: https://orcid.org/0000-0002-5015-1304)
- Frank Leferink (ORCID: https://orcid.org/0000-0001-6299-0052)
Institutions
- Thales (Netherlands) (NL)
- University of Twente (NL)
Publication Details
- Published
- 2024-09-02
- DOI
- https://doi.org/10.1109/emceurope59828.2024.10722636
- Primary Topic
- Electromagnetic Compatibility and Noise Suppression
- Type
- article
- Field-Weighted Citation Impact
- 0.00