Authors

• Subhasish Mitra (ORCID: https://orcid.org/0000-0002-5572-5194)
• Ramesh Karri (ORCID: https://orcid.org/0000-0001-7989-5617)
• Janusz Rajski (ORCID: https://orcid.org/0000-0003-2124-447X)
• Mark Tehranipoor (ORCID: https://orcid.org/0009-0006-8410-2347)
• Rob Aitken

Institutions

• National Institute of Standards and Technology (US)
• United States Department of Commerce (US)
• University of Florida (US)
• Siemens (United States) (US)
• New York University (US)
• SUNY Polytechnic Institute (US)
• Stanford University (US)

Publication Details

Journal

IEEE Design and Test

Published

2024-10-25

DOI

https://doi.org/10.1109/mdat.2024.3444745

Primary Topic

Physical Unclonable Functions (PUFs) and Hardware Security

Type

article

Field-Weighted Citation Impact

0.00