Optimal Proof-Testing Intervals with Functional Safety Constraint for E/E/PE Safety-Related Systems

Proof-testing for E/E/PE safety-related systems is known as a periodic inspection and maintenance activity to maintain their designed functional safety in operation. Generally, the proof-testing takes so much cost and time for checking the E/E/PE safety-related systems comprehensively. Therefore, effective proof-testing intervals should be considered based on the rationale for the hazardous risk and maintenance cost. As one of the approaches, there exist methods deriving economic proof-testing intervals minimizing simultaneous the proof-testing cost and the risk at hazardous event occurrence. However, the safety constraint should be needed to consider at the same time since the E/E/PE safety-related systems are required to maintain certain safety level in operation. This paper addresses a mathematical approach for obtaining optimal proof-testing intervals for such practical situations.

Authors

Institutions

Publication Details

Journal
International Journal of Reliability Quality and Safety Engineering
Published
2024-10-24
DOI
https://doi.org/10.1142/s0218539324500487
Citations
1
Primary Topic
VLSI and Analog Circuit Testing
Type
article
Field-Weighted Citation Impact
0.49
Controls
|||
ALL TIME
JAN
FEB
MAR
APR
MAY
JUN
JUL
AUG
SEP
OCT
article

Optimal Proof-Testing Intervals with Functional Safety Constraint for E/E/PE Safety-Related Systems

Takaji Fujiwara, Shigeru Yamada, Shinji Inoue
1 citations
International Journal of Reliability Quality and Safety Engineering
VLSI and Analog Circuit Testing
0.49
article

Optimal Proof-Testing Intervals with Functional Safety Constraint for E/E/PE Safety-Related Systems

Takaji Fujiwara, Shigeru Yamada, Shinji Inoue
article en
1 citations

Abstract

Proof-testing for E/E/PE safety-related systems is known as a periodic inspection and maintenance activity to maintain their designed functional safety in operation. Generally, the proof-testing takes so much cost and time for checking the E/E/PE safety-related systems comprehensively. Therefore, effective proof-testing intervals should be considered based on the rationale for the hazardous risk and maintenance cost. As one of the approaches, there exist methods deriving economic proof-testing intervals minimizing simultaneous the proof-testing cost and the risk at hazardous event occurrence. However, the safety constraint should be needed to consider at the same time since the E/E/PE safety-related systems are required to maintain certain safety level in operation. This paper addresses a mathematical approach for obtaining optimal proof-testing intervals for such practical situations.

International Journal of Reliability Quality and Safety EngineeringVol. 32(03)
Tottori University (JP), Kansai University (JP)
Openalex Percentile: Top 36%
VLSI and Analog Circuit Testing
0.49
AI Navigator

Ask Laika to Summarize, Analyze, and Connect papers live on the map.

Summarize Papers & Methodologies

Extract key findings, datasets, and comparative methods across publications.

Benchmark Rankings & Visual Analytics

Rank top research institutions, authors, funders, topics, and journals by Field-Weighted Citation Impact (FWCI) and paper volume with instant charts.

Connect Distant Disciplines

Bridge topological clusters on the map to find hidden collaborative intersections.

Optimal Proof-Testing Intervals with Functional Safety Constraint for E/E/PE Safety-Related Systems — Takaji Fujiwara, Shigeru Yamada, et al. · International Journal of Reliability Quality and Safety Engineering (2024) | TGRS Research Map | TGRS