Effect of Dielectrics on the Performance of N-Type Lateral Junctionless TFET
This article discusses the performance characteristics of Al<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</inf>O<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">3</inf>, SiO<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</inf>, and HfO<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</inf> single or dual dielectric materials as Junctionless Tunnel Field Effect Transistors (JLTFETs). Transconductance (g<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">m</inf>), energy band gap, parasitic capacitances (C<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">gs</inf>, C<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">gd</inf>, and C<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">gg</inf>), cut-off frequency (F<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">T</inf>), Gain Bandwidth Product (GBWP), subthreshold slope (SS), Ion/Ioff current, and threshold voltage (V<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">T</inf>) are among the properties that were examined. According to the study, SiO<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</inf> exhibits the least favourable outcomes, whereas HfO<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</inf> and mixtures of HfO<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</inf> and Al<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</inf>O₃ offer the best performance across most parameters. HfO2 performs better than other materials, although its high parasitic capacitances may lessen the GBWP. Although single dielectrics such as HfO<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</inf> or Al<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</inf>O₃ have clear benefits, dual dielectric combinations give a more even playing field by maximizing the trade-offs between different properties.
Authors
- Aditya Jain (ORCID: https://orcid.org/0000-0003-2509-4608)
- Piyush Bagla (ORCID: https://orcid.org/0000-0002-1664-7787)
- C Reddy (ORCID: https://orcid.org/0009-0004-4411-5691)
- Ajay Kumar (ORCID: https://orcid.org/0000-0001-8043-8253)
- Kaushal Kumar (ORCID: https://orcid.org/0000-0001-9990-1869)
- Vinay Kumar (ORCID: https://orcid.org/0000-0002-5030-290X)
Institutions
- Jaypee Institute of Information Technology (IN)
- Symbiosis International University (IN)
- Graphic Era University (IN)
Publication Details
- Published
- 2024-08-23
- DOI
- https://doi.org/10.1109/iacis61494.2024.10721963
- Primary Topic
- Advancements in Semiconductor Devices and Circuit Design
- Type
- article
- Field-Weighted Citation Impact
- 0.00