Intense Pulsed Light Annealing for High-k Capacitor Integration in 1T-1C DRAM With a-IGZO Cell Transistors

In this study, we report the integration of an a-IGZO cell transistor and a high-k ZrO2 cell capacitor using Intense Pulsed Light (IPL) annealing for 1T-1C DRAM application. With IPL annealing, the ZrO2 capacitor can successfully achieve a high k-value of 33, without any detrimental effect to the electrical performance of the IGZO transistor which is vulnerable to high temperature process. The a-IGZO transistor could maintain an ultra-low leakage current of <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$1.3\times 10^{-{16}}$ </tex-math></inline-formula> A/<inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$\mu $ </tex-math></inline-formula>m, even after the high-k dielectric crystallization process.

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Publication Details

Journal
IEEE Electron Device Letters
Published
2024-10-24
DOI
https://doi.org/10.1109/led.2024.3485609
Citations
5
Primary Topic
Semiconductor materials and devices
Type
article
Field-Weighted Citation Impact
1.04

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article

Intense Pulsed Light Annealing for High-k Capacitor Integration in 1T-1C DRAM With a-IGZO Cell Transistors

Jeho Na, Byung Jin Cho, Sung‐Yool Choi, Seohak Park et al.
5 citations
IEEE Electron Device Letters
Semiconductor materials and devices
1.04
article

Intense Pulsed Light Annealing for High-k Capacitor Integration in 1T-1C DRAM With a-IGZO Cell Transistors

Jeho Na, Byung Jin Cho, Sung‐Yool Choi, Seohak Park, H.C. Lee, Keun Heo, Seong Keun Kim, Heetae Kim, Sung Haeng Cho, Jaewook Jeong, Min Ju Kim, Chihun Sung, Jihoon Jeon
article en
5 citations

Abstract

In this study, we report the integration of an a-IGZO cell transistor and a high-k ZrO2 cell capacitor using Intense Pulsed Light (IPL) annealing for 1T-1C DRAM application. With IPL annealing, the ZrO2 capacitor can successfully achieve a high k-value of 33, without any detrimental effect to the electrical performance of the IGZO transistor which is vulnerable to high temperature process. The a-IGZO transistor could maintain an ultra-low leakage current of <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$1.3\times 10^{-{16}}$ </tex-math></inline-formula> A/<inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$\mu $ </tex-math></inline-formula>m, even after the high-k dielectric crystallization process.

IEEE Electron Device LettersVol. 45(12)
Electronics and Telecommunications Research Institute (KR), Korea Advanced Institute of Science and Technology (KR), Korea University (KR), Jeonbuk National University (KR), Dankook University (KR)
National Research Council of Science and Technology
Affordable and clean energy
Openalex Percentile: Top 23%
Semiconductor materials and devices
1.04
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