P-Channel MOSFETs on Phosphorous-Doped n-Type Diamond
P-channel metal-oxide-semiconductor field-effect transistors (MOSFETs) have been demonstrated on phosphorus-doped n-type diamond epilayers. The p-channel nature arises from the surface conductivity resulting from hydrogenated termination on the n-type diamond surface. The MOSFET exhibits normally-on properties and shows a threshold of 1.8 V for the phosphorus concentration of 1016 cm−3 and an on/off ratio of 107. The maximum drain current is approximately −4.5 mA/mm and the transconductance is 0.75 mS/mm, which decreases as the phosphorus concentration in the n-type diamond epilayer increases. The demonstration of p-channel MOSFETs on n-type diamond epilayers paves the way for the development of complementary MOS (CMOS) circuits on a single diamond wafer.
Authors
- Satoshi Koizumi (ORCID: https://orcid.org/0000-0003-4961-5658)
- Meiyong Liao (ORCID: https://orcid.org/0000-0003-1361-4266)
- Wen Zhao (ORCID: https://orcid.org/0000-0001-8159-8195)
Institutions
- National Institute for Materials Science (JP)
Publication Details
- Journal
- IEEE Electron Device Letters
- Published
- 2024-10-24
- DOI
- https://doi.org/10.1109/led.2024.3485683
- Citations
- 5
- Primary Topic
- Diamond and Carbon-based Materials Research
- Type
- article
- Field-Weighted Citation Impact
- 0.59