SYSFID—System-Aware Fault-Injection Attack Detection for System-In-Package Architectures
Abstract A system-in-package (SiP) design takes advantage of cutting-edge packaging technology and heterogeneous integration (HI) in response to the growing need for aggressive time-to-market, high-performance, less expensive, and smaller systems. However, aggregating dies with different functionalities introduces new attack vectors with fault-injection attacks (FIA) that can effectively alter a circuit's data and control flow maliciously to cause disruptions of secure communication or sensitive information leakage. Additionally, traditional threat models associated with FIA on a 2D monolithic system-on-chip (SoC), and the corresponding mitigation techniques may not be compatible with modern 2.5D and 3D SiP architectures. To address these limitations, we propose system-aware fault injection attack detection for SiP architectures (SYSFID), a real-time and on-chip sensor-based fault monitoring approach integrated into a system-level design. SYSFID detects any fault-induced anomalous alterations in path delays of the components of inter-chiplet networks by strategically placing on-chip fault-to-time converter (FTC) sensors and controlling them efficiently to safeguard overall system security. To demonstrate the effectiveness of SYSFID, we detect several fault injection attempts on the FPGA implementation of a network-on-chip (NoC) based architecture during secure network packet transfers. Our experiments also illustrate that the SYSFID framework reliably senses both global and local FIAs with minimal overheads.
Authors
- Md Latifur Rahman (ORCID: https://orcid.org/0009-0006-8773-0728)
- Amit Mazumder Shuvo (ORCID: https://orcid.org/0009-0006-1448-3973)
- Farimah Farahmandi (ORCID: https://orcid.org/0000-0003-1535-0938)
- Kimia Zamiri Azar (ORCID: https://orcid.org/0000-0001-5684-100X)
- Md Sami Ul Islam Sami (ORCID: https://orcid.org/0000-0002-3064-0741)
- Jingbo Zhou (ORCID: https://orcid.org/0000-0002-1375-9644)
- Mark Tehranipoor (ORCID: https://orcid.org/0009-0006-8410-2347)
Institutions
- University of Florida (US)
Publication Details
- Journal
- Proceedings - International Symposium for Testing and Failure Analysis
- Published
- 2024-10-23
- DOI
- https://doi.org/10.31399/asm.cp.istfa2024p0332
- Citations
- 2
- Primary Topic
- Physical Unclonable Functions (PUFs) and Hardware Security
- Type
- article
- Field-Weighted Citation Impact
- 0.98