Advanced FIB/SEM Sample Preparation and Analysis Techniques (2024 Update)

Abstract Presentation slides for the ISTFA 2024 Tutorial session “Advanced FIB/SEM Sample Preparation and Analysis Techniques (2024 Update).”

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Publication Details

Journal
Proceedings - International Symposium for Testing and Failure Analysis
Published
2024-10-23
DOI
https://doi.org/10.31399/asm.cp.istfa2024tpo1
Primary Topic
Electron and X-Ray Spectroscopy Techniques
Type
article
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article

Advanced FIB/SEM Sample Preparation and Analysis Techniques (2024 Update)

Khiem Ly, Charles Petri, Sam Subramanian, Jacob Levenson et al.
Proceedings - International Symposium for Testing and Failure Analysis
Electron and X-Ray Spectroscopy Techniques
article

Advanced FIB/SEM Sample Preparation and Analysis Techniques (2024 Update)

Khiem Ly, Charles Petri, Sam Subramanian, Jacob Levenson, Tony Chrastecky, Rohin Agny, Eric Yi
article en

Abstract

Abstract Presentation slides for the ISTFA 2024 Tutorial session “Advanced FIB/SEM Sample Preparation and Analysis Techniques (2024 Update).”

Proceedings - International Symposium for Testing and Failure AnalysisVol. 84925
Openalex Percentile: Top 82%
Electron and X-Ray Spectroscopy Techniques
DOISourceOpenAlex
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Advanced FIB/SEM Sample Preparation and Analysis Techniques (2024 Update) — Khiem Ly, Charles Petri, et al. · Proceedings - International Symposium for Testing and Failure Analysis (2024) | TGRS Research Map | TGRS