Studying the FT-IR Spectra of Flux at Different Curing Conditions for Semiconductor Applications

Abstract This paper investigates the behavior of flux compounds under different curing conditions for two distinct flux materials. To explore this behavior, we conducted two separate experimental designs. In the first design, we varied the heating temperature (ranging from 40°C to 180°C) and tested with 0.1g of flux for 50 seconds. The second design involved varying the mass volume of flux (ranging from 0.02g to 0.1g) and testing for 300 seconds at 160°C. We employed FT-IR analysis to detect any changes in the functional groups present in the flux. The results indicate that flux exposed to different curing conditions undergoes decomposition of certain functional groups. This effect becomes more pronounced with increasing temperature and decreasing flux mass volume. TQ Analyst software quantified the significant variations in the IR spectra, revealing mismatches at different curing conditions.