Basics and Current Aspects of Scanning Electron Microscopy

Abstract Presentation slides for the ISTFA 2024 Tutorial session “Basics and Current Aspects of Scanning Electron Microscopy.”

Authors

Heiko Stegmann (ORCID: https://orcid.org/0000-0001-7147-0059)

Institutions

Carl Zeiss (Germany) (DE)

Publication Details

Journal: Proceedings - International Symposium for Testing and Failure Analysis
Published: 2024-10-23
DOI: https://doi.org/10.31399/asm.cp.istfa2024tpp1
Primary Topic: Electron and X-Ray Spectroscopy Techniques
Type: article
Field-Weighted Citation Impact: 0.00

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article

Basics and Current Aspects of Scanning Electron Microscopy

Heiko Stegmann

Oct 23, 2024

Proceedings - International Symposium for Testing and Failure Analysis

Electron and X-Ray Spectroscopy Techniques

article

Basics and Current Aspects of Scanning Electron Microscopy

Heiko Stegmann

October 23, 2024article en

Abstract

Abstract Presentation slides for the ISTFA 2024 Tutorial session “Basics and Current Aspects of Scanning Electron Microscopy.”

Proceedings - International Symposium for Testing and Failure AnalysisVol. 84925

Carl Zeiss (Germany) (DE)

Openalex Percentile: Top 82%

Electron and X-Ray Spectroscopy Techniques

DOI Source OpenAlex

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Basics and Current Aspects of Scanning Electron Microscopy — Heiko Stegmann · Proceedings - International Symposium for Testing and Failure Analysis (2024) | TGRS Research Map | TGRS