Frequency-Tunable Current Imaging using a Quantum-Mixer Microscope Based on Nitrogen-Vacancy Centers in Diamond

Abstract Wide-field magnetic imagers using nitrogen-vacancy (NV) centers in diamond yield high-resolution images for various applications, including magnetic field imaging (MFI) of electronics. Despite the ongoing successes of this emerging technique for passively interrogating electronics components (including failure analysis troubleshooting), most of the focus has been on sensing DC and low-frequency currents, due to the technical challenges associated with measuring higher-frequency magnetic fields. Here, we overcome these existing challenges and adapt a recently developed technique for sensing MHz-frequency AC fields, a “quantum frequency mixing” approach. We demonstrate the instrument’s capabilities by imaging the current through a fabricated spiral test structure at various frequencies with a ~1 mm2 field of view. Finally, we discuss anticipated future applications in electronics interrogation and failure analysis for this imaging technique.

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Publication Details

Journal
Proceedings - International Symposium for Testing and Failure Analysis
Published
2024-10-23
DOI
https://doi.org/10.31399/asm.cp.istfa2024p0282
Primary Topic
Force Microscopy Techniques and Applications
Type
article
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article

Frequency-Tunable Current Imaging using a Quantum-Mixer Microscope Based on Nitrogen-Vacancy Centers in Diamond

Jennifer M. Schloss, Danielle Braje, Pauli Kehayias, Andrew C. Maccabe et al.
Proceedings - International Symposium for Testing and Failure Analysis
Force Microscopy Techniques and Applications
article

Frequency-Tunable Current Imaging using a Quantum-Mixer Microscope Based on Nitrogen-Vacancy Centers in Diamond

Jennifer M. Schloss, Danielle Braje, Pauli Kehayias, Andrew C. Maccabe, David F. Phillips, Guoqing Wang, Paola Cappellaro, Samuel J. Karlson
article en

Abstract

Abstract Wide-field magnetic imagers using nitrogen-vacancy (NV) centers in diamond yield high-resolution images for various applications, including magnetic field imaging (MFI) of electronics. Despite the ongoing successes of this emerging technique for passively interrogating electronics components (including failure analysis troubleshooting), most of the focus has been on sensing DC and low-frequency currents, due to the technical challenges associated with measuring higher-frequency magnetic fields. Here, we overcome these existing challenges and adapt a recently developed technique for sensing MHz-frequency AC fields, a “quantum frequency mixing” approach. We demonstrate the instrument’s capabilities by imaging the current through a fabricated spiral test structure at various frequencies with a ~1 mm2 field of view. Finally, we discuss anticipated future applications in electronics interrogation and failure analysis for this imaging technique.

Proceedings - International Symposium for Testing and Failure AnalysisVol. 84918
MIT Lincoln Laboratory (US), Massachusetts Institute of Technology (US)
Openalex Percentile: Top 83%
Force Microscopy Techniques and Applications
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Frequency-Tunable Current Imaging using a Quantum-Mixer Microscope Based on Nitrogen-Vacancy Centers in Diamond — Jennifer M. Schloss, Danielle Braje, et al. · Proceedings - International Symposium for Testing and Failure Analysis (2024) | TGRS Research Map | TGRS