Transmission Electron Imaging AND Diffraction in an SEM (aka, STEM-in-SEM): What, Why, and How To Do This in Your Microscope
Abstract Presentation slides for the ISTFA 2024 Tutorial session “Transmission Electron Imaging AND Diffraction in an SEM (aka, STEM-in-SEM): What, Why, and How To Do This in Your Microscope.”
Authors
- Jason Holm
Institutions
- National Institute of Standards and Technology (US)
Publication Details
- Journal
- Proceedings - International Symposium for Testing and Failure Analysis
- Published
- 2024-10-23
- DOI
- https://doi.org/10.31399/asm.cp.istfa2024tpq1
- Primary Topic
- Electron and X-Ray Spectroscopy Techniques
- Type
- article
- Field-Weighted Citation Impact
- 0.00