Photodiode-based focus monitoring in ultrashort-pulsed laser structuring of graphite anodes for lithium-ion batteries

In recent years, there has been an increased demand for elaborate monitoring techniques in laser material processing. This has been driven by the need for fast and cost-efficient quality assurance processes. At the same time, ultrashort-pulsed (USP) laser radiation has emerged as a promising technology for creating intricate microstructures in lithium-ion battery graphite anodes due to its high precision and negligible thermal impact. However, the integration of process monitoring in USP laser applications for graphite anode structuring is still unexplored. There is a lack of clarity on suitable sensors, observable parameters, and extractable process-relevant insights. The presented study addressed this gap by demonstrating the capability of state-of-the-art photodiode-based monitoring systems in collecting process-relevant data and deriving valuable insights. A sensor equipped with three photodiodes was employed to address these challenges. Exploratory data analysis and machine learning methodologies were leveraged to develop a data pipeline for processing the acquired information. The data were used to train convolutional neural networks that could accurately predict the focal position. At the same time, the limitations of traditional regression approaches could be shown. The findings advanced the understanding of the possibilities of process monitoring in USP laser applications and emphasized the significance of data-driven approaches in optimizing manufacturing processes.

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Publication Details

Journal
Journal of Laser Applications
Published
2024-10-23
DOI
https://doi.org/10.2351/7.0001565
Citations
3
Primary Topic
Integrated Circuits and Semiconductor Failure Analysis
Type
article
Field-Weighted Citation Impact
0.63

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article

Photodiode-based focus monitoring in ultrashort-pulsed laser structuring of graphite anodes for lithium-ion batteries

Michael K. Kick, Lovis Wach, Christian Bernauer, Michael F. Zaeh et al.
3 citations
Journal of Laser Applications
Integrated Circuits and Semiconductor Failure Analysis
0.63
article

Photodiode-based focus monitoring in ultrashort-pulsed laser structuring of graphite anodes for lithium-ion batteries

Michael K. Kick, Lovis Wach, Christian Bernauer, Michael F. Zaeh, Christian Geiger, Pawel Garkusha, B.L. Kasper
article en
3 citations

Abstract

In recent years, there has been an increased demand for elaborate monitoring techniques in laser material processing. This has been driven by the need for fast and cost-efficient quality assurance processes. At the same time, ultrashort-pulsed (USP) laser radiation has emerged as a promising technology for creating intricate microstructures in lithium-ion battery graphite anodes due to its high precision and negligible thermal impact. However, the integration of process monitoring in USP laser applications for graphite anode structuring is still unexplored. There is a lack of clarity on suitable sensors, observable parameters, and extractable process-relevant insights. The presented study addressed this gap by demonstrating the capability of state-of-the-art photodiode-based monitoring systems in collecting process-relevant data and deriving valuable insights. A sensor equipped with three photodiodes was employed to address these challenges. Exploratory data analysis and machine learning methodologies were leveraged to develop a data pipeline for processing the acquired information. The data were used to train convolutional neural networks that could accurately predict the focal position. At the same time, the limitations of traditional regression approaches could be shown. The findings advanced the understanding of the possibilities of process monitoring in USP laser applications and emphasized the significance of data-driven approaches in optimizing manufacturing processes.

Journal of Laser ApplicationsVol. 36(4)
Technical University of Munich (DE)
Bayerische Forschungsstiftung
Industry, innovation and infrastructure
Openalex Percentile: Top 31%
Integrated Circuits and Semiconductor Failure Analysis
0.63
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