AI-Driven Advancements in Image Processing, Analysis and 3D Modeling for Fault Isolation and Failure Analysis
Abstract Presentation slides for the ISTFA 2024 Tutorial session “AI-Driven Advancements in Image Processing, Analysis and 3D Modeling for Fault Isolation and Failure Analysis.”
Authors
- G. Lamedica
- Domenico Mello (ORCID: https://orcid.org/0000-0002-2483-9690)
- Marco Rossi (ORCID: https://orcid.org/0000-0001-7603-1805)
- Anton du Plessis (ORCID: https://orcid.org/0000-0002-4370-8661)
- Flavio Cognigni (ORCID: https://orcid.org/0000-0003-4385-376X)
- Heiko Stegmann (ORCID: https://orcid.org/0000-0001-7147-0059)
Institutions
- Carl Zeiss (Australia) (AU)
- Microelectronica (Romania) (RO)
- Comet (Switzerland) (CH)
- Swatch Group (Switzerland) (CH)
- Sapienza University of Rome (IT)
Publication Details
- Journal
- Proceedings - International Symposium for Testing and Failure Analysis
- Published
- 2024-10-23
- DOI
- https://doi.org/10.31399/asm.cp.istfa2024tpw1
- Primary Topic
- Fault Detection and Control Systems
- Type
- article
- Field-Weighted Citation Impact
- 0.00