A Comprehensive Approach for Post Silicon Unique Hold Time Violation Debug on Ethernet Interface Issue

Abstract Unique frequency dependent hold time violation debug seen on Ethernet IP that caused at least 50% yield loss is showcased in this paper. This debug exposed the process variation issue seen, limitation in current FPGA timing sign-off methodology and design limitation that led to this rare hold time behavior. Customized ATPG patterns has become de facto for effective HVM screening including exploration of new path hold time fault pattern generation. The debug was backed by tester level and system validation debug with help from optical probing and FIB to confirm the root cause and silicon fixes required.

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Publication Details

Journal
Proceedings - International Symposium for Testing and Failure Analysis
Published
2024-10-23
DOI
https://doi.org/10.31399/asm.cp.istfa2024p0320
Primary Topic
VLSI and Analog Circuit Testing
Type
article
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article

A Comprehensive Approach for Post Silicon Unique Hold Time Violation Debug on Ethernet Interface Issue

Yuet Li, Gaurav Gupta, Lee Shen Shen, Tauseef Shah et al.
Proceedings - International Symposium for Testing and Failure Analysis
VLSI and Analog Circuit Testing
article

A Comprehensive Approach for Post Silicon Unique Hold Time Violation Debug on Ethernet Interface Issue

Yuet Li, Gaurav Gupta, Lee Shen Shen, Tauseef Shah, V. Gayatri, Goh Lay Lay, Kuan Lai Khei, Wu Jia Jun
article en

Abstract

Abstract Unique frequency dependent hold time violation debug seen on Ethernet IP that caused at least 50% yield loss is showcased in this paper. This debug exposed the process variation issue seen, limitation in current FPGA timing sign-off methodology and design limitation that led to this rare hold time behavior. Customized ATPG patterns has become de facto for effective HVM screening including exploration of new path hold time fault pattern generation. The debug was backed by tester level and system validation debug with help from optical probing and FIB to confirm the root cause and silicon fixes required.

Proceedings - International Symposium for Testing and Failure AnalysisVol. 84918
Intel (United States) (US)
Openalex Percentile: Top 81%
VLSI and Analog Circuit Testing
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