Correlative Microscopy: In-Situ AFM-in-SEM Introduction, Capabilities, and Case Studies Semiconductor Materials and Batteries
Abstract Presentation slides for the ISTFA 2024 Tutorial session “Correlative Microscopy: In-Situ AFM-in-SEM Introduction, Capabilities, and Case Studies Semiconductor Materials and Batteries.”
Authors
- Veronika Hegrová (ORCID: https://orcid.org/0000-0001-9492-1924)
- Rosalinda M. Ring
- Lukáš Kormoš (ORCID: https://orcid.org/0000-0001-9099-4595)
- Umberto Celano (ORCID: https://orcid.org/0000-0002-2856-3847)
- Jan Neuman
- Libor Strakoš
- Radek Dao
- Ondøej Novotný
Institutions
- Thermo Fisher Scientific (Czechia) (CZ)
- Arizona State University (US)
Publication Details
- Journal
- Proceedings - International Symposium for Testing and Failure Analysis
- Published
- 2024-10-23
- DOI
- https://doi.org/10.31399/asm.cp.istfa2024tpk1
- Primary Topic
- Advanced Electron Microscopy Techniques and Applications
- Type
- article
- Field-Weighted Citation Impact
- 0.00