A Practical Tutorial on ATE-Based Electrical Fault Isolation of Digital SoCs Using Photon Emission and Laser Voltage Imaging/Probing (2024 Update)

Abstract Presentation slides for the ISTFA 2024 Tutorial session “A Practical Tutorial on ATE-Based Electrical Fault Isolation of Digital SoCs Using Photon Emission and Laser Voltage Imaging/Probing (2024 Update).”

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Publication Details

Journal
Proceedings - International Symposium for Testing and Failure Analysis
Published
2024-10-23
DOI
https://doi.org/10.31399/asm.cp.istfa2024tph1
Citations
1
Primary Topic
Integrated Circuits and Semiconductor Failure Analysis
Type
article
Field-Weighted Citation Impact
0.21
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article

A Practical Tutorial on ATE-Based Electrical Fault Isolation of Digital SoCs Using Photon Emission and Laser Voltage Imaging/Probing (2024 Update)

Lesly Endrinal
1 citations
Proceedings - International Symposium for Testing and Failure Analysis
Integrated Circuits and Semiconductor Failure Analysis
0.21
article

A Practical Tutorial on ATE-Based Electrical Fault Isolation of Digital SoCs Using Photon Emission and Laser Voltage Imaging/Probing (2024 Update)

Lesly Endrinal
article en
1 citations

Abstract

Abstract Presentation slides for the ISTFA 2024 Tutorial session “A Practical Tutorial on ATE-Based Electrical Fault Isolation of Digital SoCs Using Photon Emission and Laser Voltage Imaging/Probing (2024 Update).”

Proceedings - International Symposium for Testing and Failure AnalysisVol. 84925
Google (United States) (US)
Openalex Percentile: Top 47%
Integrated Circuits and Semiconductor Failure Analysis
0.21
DOISourceOpenAlex
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A Practical Tutorial on ATE-Based Electrical Fault Isolation of Digital SoCs Using Photon Emission and Laser Voltage Imaging/Probing (2024 Update) — Lesly Endrinal · Proceedings - International Symposium for Testing and Failure Analysis (2024) | TGRS Research Map | TGRS