Electron-Beam Probing of Modern Integrated Circuits: Moving Forward while Borrowing from the Past

Abstract Presentation slides for the ISTFA 2024 Tutorial session “Electron-Beam Probing of Modern Integrated Circuits: Moving Forward while Borrowing from the Past.”

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Publication Details

Journal
Proceedings - International Symposium for Testing and Failure Analysis
Published
2024-10-23
DOI
https://doi.org/10.31399/asm.cp.istfa2024tpi1
Primary Topic
Integrated Circuits and Semiconductor Failure Analysis
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article
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article

Electron-Beam Probing of Modern Integrated Circuits: Moving Forward while Borrowing from the Past

J. S. Vickers
Proceedings - International Symposium for Testing and Failure Analysis
Integrated Circuits and Semiconductor Failure Analysis
article

Electron-Beam Probing of Modern Integrated Circuits: Moving Forward while Borrowing from the Past

J. S. Vickers
article en

Abstract

Abstract Presentation slides for the ISTFA 2024 Tutorial session “Electron-Beam Probing of Modern Integrated Circuits: Moving Forward while Borrowing from the Past.”

Proceedings - International Symposium for Testing and Failure AnalysisVol. 84925
Thermo Fisher Scientific (United States) (US)
Openalex Percentile: Top 84%
Integrated Circuits and Semiconductor Failure Analysis
DOISourceOpenAlex
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Electron-Beam Probing of Modern Integrated Circuits: Moving Forward while Borrowing from the Past — J. S. Vickers · Proceedings - International Symposium for Testing and Failure Analysis (2024) | TGRS Research Map | TGRS