Machine Learning in Semiconductor Failure Analysis: Techniques and Case Studies
Abstract Presentation slides for the ISTFA 2024 Tutorial session “Machine Learning in Semiconductor Failure Analysis: Techniques and Case Studies.”
Authors
- Sebastian Brand (ORCID: https://orcid.org/0000-0003-2278-2042)
- Michael Kögel
- Frank Altmann (ORCID: https://orcid.org/0000-0002-0202-1193)
Institutions
- Fraunhofer Institute for Microstructure of Materials and Systems (DE)
Publication Details
- Journal
- Proceedings - International Symposium for Testing and Failure Analysis
- Published
- 2024-10-23
- DOI
- https://doi.org/10.31399/asm.cp.istfa2024tpv1
- Primary Topic
- Integrated Circuits and Semiconductor Failure Analysis
- Type
- article
- Field-Weighted Citation Impact
- 0.00