Event-Driven Voltage Reference with Bandgap-Class Temperature Coefficient Across-Corner with 100-pW Power at 0.8 V

A voltage reference with event-driven temperature compensation is proposed to reduce power under common-case moderate fluctuations. An accurate reference is occasionally turned on to fine-tune a low-power clone when temperature changes by more than a threshold. As opposed to sample and hold references whose period is limited by capacitor discharge due to leakage, the proposed reference has unrestrictedly long off-periods and reduce power below 100 pW. At the same time, bandgap-class temperature coefficient and low process sensitivity across corners are achieved in 180 nm.