Chemically Stable Group IV–V Transition Metal Carbide Thin Films in Hydrogen Radical Environments

Hydrogen is a crucial element in the green energy transition. However, its tendency to react with and diffuse into surrounding materials poses a significant challenge. Therefore, developing coatings to protect system components in hydrogen environments (molecular, radicals (H*), and plasma) is essential. In this work, we report group IV-V transition metal carbide (TMC) thin films as potential candidates for protective coatings in H* environments at elevated temperatures. We expose TiC, ZrC, HfC, VC, NbC, TaC, and Co<sub>2</sub>C thin films, with native surface oxycarbides/oxides (TMO <sub><i>x</i></sub> C <sub><i>y</i></sub> /TMO <sub><i>x</i></sub> ), to H* at elevated temperatures. Based on X-ray photoelectron spectroscopy performed on the samples before and after H*-exposure, we identify three classes of TMCs. HfC, ZrC, TiC, TaC, NbC, and VC (class A) are found to have a stable carbidic-C (TM-C) content, with a further subdivision into partial (class A1: HfC, ZrC, and TiC) and strong (class A2: TaC, NbC, and VC) surface deoxidation. In contrast to class A, a strong carbide reduction is observed in Co<sub>2</sub>C (class B), along with a strong surface deoxidation. The H* interaction with TMC/TMO <sub><i>x</i></sub> C <sub><i>y</i></sub> /TMO <sub><i>x</i></sub> is hypothesized to entail three processes: (i) hydrogenation of surface C/O atoms, (ii) formation of CH <sub><i>x</i></sub> /OH <sub><i>x</i></sub> species, and (iii) subsurface C/O atom diffusion to the surface vacancies. The number of adsorbed H atoms required to form CH <sub><i>x</i></sub> /OH <sub><i>x</i></sub> species (i) and the corresponding thermodynamic energy barriers (ii) are estimated based on the change in the Gibbs free energy (Δ<i>G</i>) for the reduction reactions of TMCs and TMO <sub><i>x</i></sub> . Hydrogenation of surface carbidic-C atoms is proposed to limit the reduction of TMCs, whereas the deoxidation of TMC surfaces is governed by the thermodynamic energy barrier for forming H<sub>2</sub>O.

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Publication Details

Journal
The Journal of Physical Chemistry C
Published
2024-10-22
DOI
https://doi.org/10.1021/acs.jpcc.4c04822
Citations
3
Primary Topic
Semiconductor materials and devices
Type
article
Field-Weighted Citation Impact
0.63

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article

Chemically Stable Group IV–V Transition Metal Carbide Thin Films in Hydrogen Radical Environments

Marcelo Ackermann, Robbert Wilhelmus Elisabeth van de Kruijs, Jacobus M. Sturm, Wesley T. E. van den Beld et al.
3 citations
The Journal of Physical Chemistry C
Semiconductor materials and devices
0.63
article

Chemically Stable Group IV–V Transition Metal Carbide Thin Films in Hydrogen Radical Environments

Marcelo Ackermann, Robbert Wilhelmus Elisabeth van de Kruijs, Jacobus M. Sturm, Wesley T. E. van den Beld, Abdul Rehman
article en
3 citations

Abstract

Hydrogen is a crucial element in the green energy transition. However, its tendency to react with and diffuse into surrounding materials poses a significant challenge. Therefore, developing coatings to protect system components in hydrogen environments (molecular, radicals (H*), and plasma) is essential. In this work, we report group IV-V transition metal carbide (TMC) thin films as potential candidates for protective coatings in H* environments at elevated temperatures. We expose TiC, ZrC, HfC, VC, NbC, TaC, and Co<sub>2</sub>C thin films, with native surface oxycarbides/oxides (TMO <sub><i>x</i></sub> C <sub><i>y</i></sub> /TMO <sub><i>x</i></sub> ), to H* at elevated temperatures. Based on X-ray photoelectron spectroscopy performed on the samples before and after H*-exposure, we identify three classes of TMCs. HfC, ZrC, TiC, TaC, NbC, and VC (class A) are found to have a stable carbidic-C (TM-C) content, with a further subdivision into partial (class A1: HfC, ZrC, and TiC) and strong (class A2: TaC, NbC, and VC) surface deoxidation. In contrast to class A, a strong carbide reduction is observed in Co<sub>2</sub>C (class B), along with a strong surface deoxidation. The H* interaction with TMC/TMO <sub><i>x</i></sub> C <sub><i>y</i></sub> /TMO <sub><i>x</i></sub> is hypothesized to entail three processes: (i) hydrogenation of surface C/O atoms, (ii) formation of CH <sub><i>x</i></sub> /OH <sub><i>x</i></sub> species, and (iii) subsurface C/O atom diffusion to the surface vacancies. The number of adsorbed H atoms required to form CH <sub><i>x</i></sub> /OH <sub><i>x</i></sub> species (i) and the corresponding thermodynamic energy barriers (ii) are estimated based on the change in the Gibbs free energy (Δ<i>G</i>) for the reduction reactions of TMCs and TMO <sub><i>x</i></sub> . Hydrogenation of surface carbidic-C atoms is proposed to limit the reduction of TMCs, whereas the deoxidation of TMC surfaces is governed by the thermodynamic energy barrier for forming H<sub>2</sub>O.

The Journal of Physical Chemistry CVol. 128(43)
University of Twente (NL)
Carl-Zeiss-Stiftung, University of Twente, Nederlandse Organisatie voor Wetenschappelijk Onderzoek, ASML
Openalex Percentile: Top 31%
Semiconductor materials and devices
0.63
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