Cornertronics in Two-Dimensional Second-Order Topological Insulators

Traditional electronic devices rely on the electron's intrinsic degrees of freedom (d.o.f.) to process information. However, additional d.o.f., like the valley, can emerge in the low-energy states of certain systems. Here, we show that the quantum dots constructed from two-dimensional second-order topological insulators posses a new kind of d.o.f., namely corner freedom, related to the topological corner states that reside at different corners of the systems. Since the corner states are well separated in real space, they can be individually and intuitively manipulated, giving rise to the concept of cornertronics. Via symmetry analysis and material search, we identify the TiSiCO-family monolayers as the first prototype of cornertronics materials, where the corner states can be controlled by both electric and optical fields due to novel corner-layer coupling effect and corner-contrasted linear dichroism. Furthermore, we find that the band gap of the TiSiCO nanodisk lies in the terahertz region and is robust to size reduction. These results indicate that the TiSiCO nanodisks can be used to design terahertz devices with ultrasmall size and electric-field tunable band gap. Besides, the TiSiCO nanodisks are simultaneously sensitive to both the strength and polarization of the terahertz waves. Our findings not only pave the way for cornertronics, but also open a new direction for research in two-dimensional second-order topological insulators, quantum dots, and terahertz electronics.

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Publication Details

Journal
Physical Review Letters
Published
2024-10-22
DOI
https://doi.org/10.1103/physrevlett.133.176602
Citations
22
Primary Topic
Topological Materials and Phenomena
Type
article
Field-Weighted Citation Impact
7.43

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article

Cornertronics in Two-Dimensional Second-Order Topological Insulators

Xiao-Ping Li, Zeying Zhang, Chaoxi Cui, Zhi‐Ming Yu et al.
22 citations
Physical Review Letters
Topological Materials and Phenomena
7.43
article

Cornertronics in Two-Dimensional Second-Order Topological Insulators

Xiao-Ping Li, Zeying Zhang, Chaoxi Cui, Zhi‐Ming Yu, Tingting Zhang, Yugui Yao, Y.S. Han
article en
22 citations

Abstract

Traditional electronic devices rely on the electron's intrinsic degrees of freedom (d.o.f.) to process information. However, additional d.o.f., like the valley, can emerge in the low-energy states of certain systems. Here, we show that the quantum dots constructed from two-dimensional second-order topological insulators posses a new kind of d.o.f., namely corner freedom, related to the topological corner states that reside at different corners of the systems. Since the corner states are well separated in real space, they can be individually and intuitively manipulated, giving rise to the concept of cornertronics. Via symmetry analysis and material search, we identify the TiSiCO-family monolayers as the first prototype of cornertronics materials, where the corner states can be controlled by both electric and optical fields due to novel corner-layer coupling effect and corner-contrasted linear dichroism. Furthermore, we find that the band gap of the TiSiCO nanodisk lies in the terahertz region and is robust to size reduction. These results indicate that the TiSiCO nanodisks can be used to design terahertz devices with ultrasmall size and electric-field tunable band gap. Besides, the TiSiCO nanodisks are simultaneously sensitive to both the strength and polarization of the terahertz waves. Our findings not only pave the way for cornertronics, but also open a new direction for research in two-dimensional second-order topological insulators, quantum dots, and terahertz electronics.

Physical Review LettersVol. 133(17)
Beijing Institute of Technology (CN), Chinese Academy of Sciences (CN), Inner Mongolia University (CN), Institute of Physics (CN), Beijing University of Chemical Technology (CN)
National Natural Science Foundation of China, National Key Research and Development Program of China
Affordable and clean energy
Openalex Percentile: Top 2%
Topological Materials and Phenomena
7.43
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