Development of crystal optics for X-ray multi-projection imaging for synchrotron and XFEL sources

X-ray multi-projection imaging (XMPI) is an emerging experimental technique for the acquisition of rotation-free, time-resolved, volumetric information on stochastic processes. The technique is developed for high-brilliance light-source facilities, aiming to address known limitations of state-of-the-art imaging methods in the acquisition of 4D sample information, linked to their need for sample rotation. XMPI relies on a beam-splitting scheme, that illuminates a sample from multiple, angularly spaced viewpoints, and employs fast, indirect, X-ray imaging detectors for the collection of the data. This approach enables studies of previously inaccessible phenomena of industrial and societal relevance such as fractures in solids, propagation of shock waves, laser-based 3D printing, or even fast processes in the biological domain. In this work, we discuss in detail the beam-splitting scheme of XMPI. More specifically, we explore the relevant properties of X-ray splitter optics for their use in XMPI schemes, both at synchrotron insertion devices and XFEL facilities. Furthermore, we describe two distinct XMPI schemes, designed to faciliate large samples and complex sample environments. Finally, we present experimental proof of the feasibility of MHz-rate XMPI at the European XFEL. This detailed overview aims to state the challenges and the potential of XMPI and act as a stepping stone for future development of the technique.

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Publication Details

Journal
Journal of Synchrotron Radiation
Published
2024-10-21
DOI
https://doi.org/10.1107/s1600577524008488
Citations
4
Primary Topic
Advanced X-ray Imaging Techniques
Type
article
Field-Weighted Citation Impact
2.43

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article

Development of crystal optics for X-ray multi-projection imaging for synchrotron and XFEL sources

Tokushi Sato, Gabriele Giovanetti, Alke Meents, Henry N. Chapman et al.
4 citations
Journal of Synchrotron Radiation
Advanced X-ray Imaging Techniques
2.43
article

Development of crystal optics for X-ray multi-projection imaging for synchrotron and XFEL sources

Tokushi Sato, Gabriele Giovanetti, Alke Meents, Henry N. Chapman, Luigi Adriano, D. Korytár, Zdenko Zápražný, Jozef Uličný, Jayanath Koliyadu, Šarlota Birnšteinová, Carsten Deiter, Adrian P. Mancuso⋈, Zisheng Yao, Liubov Samoylova, A. Mazzolari, Heiko Kollmann, E. M. Asimakopoulou, Ilia Petrov, Romain Letrun, Richard Bean, Valerio Bellucci, Pablo Villanueva‐Perez, Patrik Vagovič, Rita Graceffa, Luis López Morillo, M. Romagnoni, Helge Huelsen, Thu Nhi Tran Calliste, Chan Kim, Yuhe Zhang
article en
4 citations

Abstract

X-ray multi-projection imaging (XMPI) is an emerging experimental technique for the acquisition of rotation-free, time-resolved, volumetric information on stochastic processes. The technique is developed for high-brilliance light-source facilities, aiming to address known limitations of state-of-the-art imaging methods in the acquisition of 4D sample information, linked to their need for sample rotation. XMPI relies on a beam-splitting scheme, that illuminates a sample from multiple, angularly spaced viewpoints, and employs fast, indirect, X-ray imaging detectors for the collection of the data. This approach enables studies of previously inaccessible phenomena of industrial and societal relevance such as fractures in solids, propagation of shock waves, laser-based 3D printing, or even fast processes in the biological domain. In this work, we discuss in detail the beam-splitting scheme of XMPI. More specifically, we explore the relevant properties of X-ray splitter optics for their use in XMPI schemes, both at synchrotron insertion devices and XFEL facilities. Furthermore, we describe two distinct XMPI schemes, designed to faciliate large samples and complex sample environments. Finally, we present experimental proof of the feasibility of MHz-rate XMPI at the European XFEL. This detailed overview aims to state the challenges and the potential of XMPI and act as a stepping stone for future development of the technique.

Journal of Synchrotron RadiationVol. 31(6)
Universität Hamburg (DE), Lund University (SE), University of Ferrara (IT), University of Pavol Jozef Šafárik (SK), European Synchrotron Radiation Facility (FR), Institute of Electrical Engineering of the Slovak Academy of Sciences (SK), SmarAct (Germany) (DE), Center for Free-Electron Laser Science (DE), Integra TDS (Slovakia) (SK), European X-Ray Free-Electron Laser (DE)
Vedecká Grantová Agentúra MŠVVaŠ SR a SAV, Röntgen-Ångström Cluster, HORIZON EUROPE Framework Programme, European Research Council
Industry, innovation and infrastructure
Openalex Percentile: Top 11%
Advanced X-ray Imaging Techniques
2.43
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