Evaluation of X-ray fluorescence for analysing critical elements in three electronic waste matrices: A comprehensive comparison of analytical techniques

As the drive towards recycling electronic waste increases, demand for rapid and reliable analytical methodology to analyse the metal content of the waste is increasing, e.g. to assess the value of the waste and to decide the correct recycling routes. Here, we comprehensively assess the suitability of different x-ray fluorescence spectroscopy (XRF)-based techniques as rapid analytical tools for the determination of critical raw materials, such as Al, Ti, Mn, Fe, Co, Ni, Cu, Zn, Nb, Pd and Au, in three electronic waste matrices: printed circuit boards (PCB), light emitting diodes (LED), and lithium (Li)-ion batteries. As validated reference methods and materials to establish metrological traceability are lacking, several laboratories measured test samples of each matrix using XRF as well as other independent complementary techniques (instrumental neutron activation analysis (INAA), inductively coupled plasma mass spectrometry (ICP-MS) and ICP optical emission spectrometry (OES)) as an inter-laboratory comparison (ILC). Results highlighted key aspects of sample preparation, limits of detection, and spectral interferences that affect the reliability of XRF, while additionally highlighting that XRF can provide more reliable data for certain elements compared to digestion-based approaches followed by ICP-MS analysis (e.g. group 4 and 5 metals). A clear distinction was observed in data processing methodologies for wavelength dispersive XRF, highlighting that considering the metals present as elements (rather than oxides) induces overestimations of the mass fractions when compared to other techniques. Eventually, the effect of sample particle size was studied and indicated that smaller particle size (<200 µm) is essential for reliable determinations.

Authors

Institutions

Publication Details

Journal
Waste Management
Published
2024-10-19
DOI
https://doi.org/10.1016/j.wasman.2024.10.015
Citations
13
Primary Topic
Recycling and Waste Management Techniques
Type
article
Field-Weighted Citation Impact
3.81

Funders

Controls
|||
ALL TIME
JAN
FEB
MAR
APR
MAY
JUN
JUL
AUG
SEP
OCT
article

Evaluation of X-ray fluorescence for analysing critical elements in three electronic waste matrices: A comprehensive comparison of analytical techniques

Axel Pramann, Jessica A. Stammeier, Luigi Bergamaschi, Timo Sara-Aho et al.
13 citations
Waste Management
Recycling and Waste Management Techniques
3.81
article

Evaluation of X-ray fluorescence for analysing critical elements in three electronic waste matrices: A comprehensive comparison of analytical techniques

Axel Pramann, Jessica A. Stammeier, Luigi Bergamaschi, Timo Sara-Aho, Simone Trimmel, Daniel Pröfrock, Valérie Laperche, Alessandra Rachetti, Johanna Irrgeher, Giancarlo D’Agostino, Anita Roethke, Ole Klein, Marco Di Luzio, Eskil Sahlin, Olaf Rienitz, Aida Jotanovic, Shaun T. Lancaster, Jean Philippe Ghestem, Solène Touzé, Radojko Jačimović, Jochen Vogl, Claire Dalencourt, Marcus Oelze, Lena Michaliszyn, Laura Feiner, Markus Ostermann, Régine Gendre, Gala Košarac, Melissa Eberhard
article en
13 citations

Abstract

As the drive towards recycling electronic waste increases, demand for rapid and reliable analytical methodology to analyse the metal content of the waste is increasing, e.g. to assess the value of the waste and to decide the correct recycling routes. Here, we comprehensively assess the suitability of different x-ray fluorescence spectroscopy (XRF)-based techniques as rapid analytical tools for the determination of critical raw materials, such as Al, Ti, Mn, Fe, Co, Ni, Cu, Zn, Nb, Pd and Au, in three electronic waste matrices: printed circuit boards (PCB), light emitting diodes (LED), and lithium (Li)-ion batteries. As validated reference methods and materials to establish metrological traceability are lacking, several laboratories measured test samples of each matrix using XRF as well as other independent complementary techniques (instrumental neutron activation analysis (INAA), inductively coupled plasma mass spectrometry (ICP-MS) and ICP optical emission spectrometry (OES)) as an inter-laboratory comparison (ILC). Results highlighted key aspects of sample preparation, limits of detection, and spectral interferences that affect the reliability of XRF, while additionally highlighting that XRF can provide more reliable data for certain elements compared to digestion-based approaches followed by ICP-MS analysis (e.g. group 4 and 5 metals). A clear distinction was observed in data processing methodologies for wavelength dispersive XRF, highlighting that considering the metals present as elements (rather than oxides) induces overestimations of the mass fractions when compared to other techniques. Eventually, the effect of sample particle size was studied and indicated that smaller particle size (<200 µm) is essential for reliable determinations.

Waste ManagementVol. 190
Physikalisch-Technische Bundesanstalt (DE), Federal Institute For Materials Research and Testing (DE), Montanuniversität Leoben (AT), Finnish Environment Institute (FI), RISE Research Institutes of Sweden (SE), Jožef Stefan Institute (SI), Eramet (France) (FR), Institute of Metrology of Bosnia and Herzegovina (BA), Istituto Nazionale di Ricerca Metrologica (IT), Helmholtz-Zentrum Hereon (DE), Sacred Heart Hospital (US), GFZ Helmholtz Centre for Geosciences (DE), Bureau de Recherches Géologiques et Minières (FR)
European Commission, Horizon 2020 Framework Programme, European Metrology Programme for Innovation and Research
Openalex Percentile: Top 7%
Recycling and Waste Management Techniques
3.81
AI Navigator

Ask Laika to Summarize, Analyze, and Connect papers live on the map.

Summarize Papers & Methodologies

Extract key findings, datasets, and comparative methods across publications.

Benchmark Rankings & Visual Analytics

Rank top research institutions, authors, funders, topics, and journals by Field-Weighted Citation Impact (FWCI) and paper volume with instant charts.

Connect Distant Disciplines

Bridge topological clusters on the map to find hidden collaborative intersections.