The Identification of Microstructural Changes in High-Temperature Superconducting Tapes for Superconducting Fault Current Limiters

HTS 2G tapes used in Superconducting Fault Current Limiters (SFCLs) have properties that allow for the effective limitation of short-circuit currents; however, due to the specificity of the device operation, they should be characterized by the high stability of the parameters when repeatedly leaving the superconducting state. During the operation of SFCLs, a situation may occur in which the parameters of the HTS tapes used will change several times as a result of the action of short-circuit currents that exceed the critical current IC of the superconductor of the tape used. This paper presents the results of microstructural tests of 2G HTS tapes intended for SFCLs, subjected to surge currents corresponding to prospective short-circuit currents with values higher than their critical currents IC and for which IC changes were observed. The HTS tapes were examined using a JEOL 7600F field emission scanning electron microscope (SEM), and their chemical composition was analyzed using Energy-Dispersive X-ray Spectroscopy (EDS). The test results indicate the possibility of micro-damage in the form of cracks in the superconductor layer, as well as the interruption of the buffer layers and the oxidation of the silver layers. The analysis of the chemical composition of the HTS tape layers may indicate the occurrence of diffusion processes.