Study of Mutual Crosstalk Between Hemispheres in Roughness Hemispherical Model

Current state-of-the-art roughness models often overlook mutual crosstalk, like between planes and protrusions or among protrusions themselves, resulting in limited generalization or accuracy at high frequencies. Building on this premise, this letter delves into the unexplored realm of mutual crosstalk between hemispheres, a factor previously omitted in the hemispherical models. Through refined calculations of internal inductance, this study effectively enhances the predictive accuracy of the hemispherical model. Regarding the sidewall roughness hemispherical model of through-glass vias (TGVs), the mutual inductance of two hemispheres in parallel and series is derived by arranging the sidewall roughness of TGVs into an equivalent model with a rows and b columns, respectively. Subsequently, it separately derives the parasitic internal inductances originating from planes and hemispheres, comparing internal inductances in cases that consider or disregard mutual crosstalk between hemispheres. The findings underscore underpredicted internal inductance values when mutual inductance is not accounted for. Finally, the proposed model undergoes comparison with measurements up to 40 GHz, demonstrating good agreement and validating the model’s efficacy.

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Publication Details

Journal
IEEE Transactions on Components Packaging and Manufacturing Technology
Published
2024-10-18
DOI
https://doi.org/10.1109/tcpmt.2024.3483194
Primary Topic
Surface Roughness and Optical Measurements
Type
article
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article

Study of Mutual Crosstalk Between Hemispheres in Roughness Hemispherical Model

Xingzhou Cai, Jinxu Liu, Libin Gao, Hongwei Chen et al.
IEEE Transactions on Components Packaging and Manufacturing Technology
Surface Roughness and Optical Measurements
article

Study of Mutual Crosstalk Between Hemispheres in Roughness Hemispherical Model

Xingzhou Cai, Jinxu Liu, Libin Gao, Hongwei Chen, Zhen Fang, Shuqi Li, Wanli Zhang, Jihua Zhang
article en

Abstract

Current state-of-the-art roughness models often overlook mutual crosstalk, like between planes and protrusions or among protrusions themselves, resulting in limited generalization or accuracy at high frequencies. Building on this premise, this letter delves into the unexplored realm of mutual crosstalk between hemispheres, a factor previously omitted in the hemispherical models. Through refined calculations of internal inductance, this study effectively enhances the predictive accuracy of the hemispherical model. Regarding the sidewall roughness hemispherical model of through-glass vias (TGVs), the mutual inductance of two hemispheres in parallel and series is derived by arranging the sidewall roughness of TGVs into an equivalent model with a rows and b columns, respectively. Subsequently, it separately derives the parasitic internal inductances originating from planes and hemispheres, comparing internal inductances in cases that consider or disregard mutual crosstalk between hemispheres. The findings underscore underpredicted internal inductance values when mutual inductance is not accounted for. Finally, the proposed model undergoes comparison with measurements up to 40 GHz, demonstrating good agreement and validating the model’s efficacy.

IEEE Transactions on Components Packaging and Manufacturing TechnologyVol. 14(11)
University of Electronic Science and Technology of China (CN), Dongguan University of Technology (CN), National Engineering Research Center of Electromagnetic Radiation Control Materials (CN)
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Openalex Percentile: Top 80%
Surface Roughness and Optical Measurements
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Study of Mutual Crosstalk Between Hemispheres in Roughness Hemispherical Model — Xingzhou Cai, Jinxu Liu, et al. · IEEE Transactions on Components Packaging and Manufacturing Technology (2024) | TGRS Research Map | TGRS