Direct phase measurement of waveguides with a next generation optical vector spectrum analyzer
A novel dual-mode optical vector spectrum analyzer is demonstrated that is suitable for the characterization of both passive devices as well as active laser sources. It can measure loss, phase response, and dispersion properties over a broad bandwidth, with high resolution and dynamic range.
Authors
- Andrew Grieco
Institutions
- University of California San Diego (US)
- Qualcomm (United States) (US)
Publication Details
- Journal
- Light Science & Applications
- Published
- 2024-10-19
- DOI
- https://doi.org/10.1038/s41377-024-01574-3
- Citations
- 2
- Primary Topic
- Advanced Fiber Laser Technologies
- Type
- article
- Field-Weighted Citation Impact
- 0.68