Non-Arrhenius Degradation Model for Stress Relaxation in Electromagnetic Relay Using Accelerated Degradation Test

This article presents a paradigm shift in the evaluation of electronic product reliability, a cornerstone in mitigating risks inherent in electrical systems. The accuracy of reliability assessments hinges critically on degradation models, which frame the landscape of analysis. However, the ubiquitous Arrhenius model, despite its merits, encounters limitations in broad temperature applicability, deviating from empirical data beyond a critical threshold. The elusive identification of this threshold challenges, as degradation tests are both time consuming and resource-intensive. Furthermore, the Arrhenius approach struggles with complex data from progressive stress accelerated degradation tests, where nonconstant stress patterns emerge. To address these shortcomings, this groundbreaking study delves into the microscopic mysteries of metal spring stress relaxation, uncovering the fundamental nature of this phenomenon. From this microscopic perspective, this article introduces a novel degradation model, grounded firmly in the error function. The results from exhaustive constant and progressive stress accelerated degradation tests validate the superiority of the proposed model, surpassing the empirical Arrhenius formula in accuracy and reliability. This triumph stems from this model's meticulous consideration of the microscopic dynamics of stress relaxation, offering a more precise and robust framework for electronic reliability analysis.