An Improved 1X De-Embedding Method for Fixtures With Impedance Discontinuities

The conventional 1X de-embedding method based on time-domain reflectometry (TDR) loses accuracy when there are impedance discontinuities at the terminal of fixtures. To address this issue, this article proposes an improved 1X de-embedded method. By connecting an extension line to the terminal of the fixture, which is used as an OPEN_EX standard, the proposed method precisely identifies peaks resulting from the impedance discontinuities at the terminal, thereby accurately reconstruct the <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"><tex-math notation="LaTeX">${{\mathbf{S}}_{11}}$</tex-math></inline-formula> and <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"><tex-math notation="LaTeX">${{\mathbf{S}}_{22}}$</tex-math></inline-formula> of the fixture. The proposed method is performed on numerical and measurement examples and demonstrates higher accuracy, while keeping the same efficiency as the traditional 1X method.