Fault diagnosis of reducers based on digital twins and deep learning

A new method was proposed to address fault diagnosis by applying the digital twin (DT) high-fidelity behavior and the deep learning (DL) data mining capabilities. Subsequently, the proposed fault distribution GAN (FDGAN) was built to map virtual and physical entities for the data from the established test platform. Finally, the MobileViG was employed to validate the model and diagnose faults. The accuracy of the proposed method with training samples of 600 and 800 were 88.4% and 99.5%, respectively. These accuracies surpass those of other methods based on CycleGAN (98.86%), CACGAN (94.92%), ACGAN (86.45%), ML1D-GAN (82.33%), and transfer learning (99.38%). Therefore, with the integration of global connectivity, an innovative network structure, and training methods, FDGAN can effectively address challenges such as network degradation, limited feature extraction in small windows, and insufficient model robustness.

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Publication Details

Journal
Scientific Reports
Published
2024-10-17
DOI
https://doi.org/10.1038/s41598-024-75112-x
Citations
13
Primary Topic
Integrated Circuits and Semiconductor Failure Analysis
Type
article
Field-Weighted Citation Impact
2.71

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article

Fault diagnosis of reducers based on digital twins and deep learning

Bin Han, Sayyed Bijan Jia, Wei‐Min Liu, Aiyun Zheng et al.
13 citations
Scientific Reports
Integrated Circuits and Semiconductor Failure Analysis
2.71
article

Fault diagnosis of reducers based on digital twins and deep learning

Bin Han, Sayyed Bijan Jia, Wei‐Min Liu, Aiyun Zheng, Zhi Zheng, Shujun Chen
article en
13 citations

Abstract

A new method was proposed to address fault diagnosis by applying the digital twin (DT) high-fidelity behavior and the deep learning (DL) data mining capabilities. Subsequently, the proposed fault distribution GAN (FDGAN) was built to map virtual and physical entities for the data from the established test platform. Finally, the MobileViG was employed to validate the model and diagnose faults. The accuracy of the proposed method with training samples of 600 and 800 were 88.4% and 99.5%, respectively. These accuracies surpass those of other methods based on CycleGAN (98.86%), CACGAN (94.92%), ACGAN (86.45%), ML1D-GAN (82.33%), and transfer learning (99.38%). Therefore, with the integration of global connectivity, an innovative network structure, and training methods, FDGAN can effectively address challenges such as network degradation, limited feature extraction in small windows, and insufficient model robustness.

Scientific ReportsVol. 14(1)
North China University of Science and Technology (CN), Tangshan College (CN)
Natural Science Foundation of Hebei Province, Hebei Province Science and Technology Support Program
Openalex Percentile: Top 9%
Integrated Circuits and Semiconductor Failure Analysis
2.71
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Fault diagnosis of reducers based on digital twins and deep learning — Bin Han, Sayyed Bijan Jia, et al. · Scientific Reports (2024) | TGRS Research Map | TGRS