Enhanced Defect Detection in Insulator Iron Caps Using Improved YOLOv8n

To address the challenges in detecting surface defects on insulator iron caps, particularly due to the complex backgrounds that hinder accurate identification, an improved defect detection algorithm based on YOLOv8n, whose full name is You Only Look Once version 8 nano, was proposed.The C2f convolutional layers in both the backbone and neck networks were replaced by the C2f-Spatial and Channel Reconstruction Convolution (SCConv) convolutional network, which strengthens the model's capacity to extract detailed surface defect features.Additionally, a Convolutional Block Attention Module (CBAM) was incorporated after the Spatial Pyramid Pooling -Fast (SPPF) layer, enhancing the extraction of deep feature information.Furthermore, the original feature fusion method in YOLOv8n was replaced with a Bidirectional Feature Pyramid Network (BiFPN), significantly improving the detection accuracy.Extensive experiments conducted on a self-constructed dataset demonstrated the effectiveness of this approach, with improvements of 2.7% and 2.9% in [email protected] and [email protected],respectively.The results confirm that the proposed algorithm exhibits strong robustness and superior performance in detecting insulator iron cap defects under varied conditions.

Authors

Publication Details

Journal
Information Dynamics and Applications
Published
2024-09-05
DOI
https://doi.org/10.56578/ida030302
Primary Topic
Industrial Vision Systems and Defect Detection
Type
article
Field-Weighted Citation Impact
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article

Enhanced Defect Detection in Insulator Iron Caps Using Improved YOLOv8n

Song Tang, Ying Liu, K. Kang, Qiming Zhang
Information Dynamics and Applications
Industrial Vision Systems and Defect Detection
article

Enhanced Defect Detection in Insulator Iron Caps Using Improved YOLOv8n

Song Tang, Ying Liu, K. Kang, Qiming Zhang
article en

Abstract

To address the challenges in detecting surface defects on insulator iron caps, particularly due to the complex backgrounds that hinder accurate identification, an improved defect detection algorithm based on YOLOv8n, whose full name is You Only Look Once version 8 nano, was proposed.The C2f convolutional layers in both the backbone and neck networks were replaced by the C2f-Spatial and Channel Reconstruction Convolution (SCConv) convolutional network, which strengthens the model's capacity to extract detailed surface defect features.Additionally, a Convolutional Block Attention Module (CBAM) was incorporated after the Spatial Pyramid Pooling -Fast (SPPF) layer, enhancing the extraction of deep feature information.Furthermore, the original feature fusion method in YOLOv8n was replaced with a Bidirectional Feature Pyramid Network (BiFPN), significantly improving the detection accuracy.Extensive experiments conducted on a self-constructed dataset demonstrated the effectiveness of this approach, with improvements of 2.7% and 2.9% in [email protected] and [email protected],respectively.The results confirm that the proposed algorithm exhibits strong robustness and superior performance in detecting insulator iron cap defects under varied conditions.

Information Dynamics and ApplicationsVol. 3(3)
Openalex Percentile: Top 74%
Industrial Vision Systems and Defect Detection
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