LDF-BNN: A Real-Time and High-Accuracy Binary Neural Network Accelerator Based on the Improved BNext

Significant progress has been made in industrial defect detection due to the powerful feature extraction capabilities of deep neural networks (DNNs). However, the high computational cost and memory requirement of DNNs pose a great challenge to the deployment of industrial edge-side devices. Although traditional binary neural networks (BNNs) have the advantages of small storage space requirements, high parallel computing capability, and low power consumption, the problem of significant accuracy degradation cannot be ignored. To tackle these challenges, this paper constructs a BNN with layered data fusion mechanism (LDF-BNN) based on BNext. By introducing the above mechanism, it strives to minimize the bandwidth pressure while reducing the loss of accuracy. Furthermore, we have designed an efficient hardware accelerator architecture based on this mechanism, enhancing the performance of high-accuracy BNN models with complex network structures. Additionally, the introduction of multi-storage parallelism alleviates the limitations imposed by the internal transfer rate, thus improving the overall computational efficiency. The experimental results show that our proposed LDF-BNN outperforms other methods in the comprehensive comparison, achieving a high accuracy of 72.23%, an image processing rate of 72.6 frames per second (FPS), and 1826 giga operations per second (GOPs) on the ImageNet dataset. Meanwhile, LDF-BNN can also be well applied to defect detection dataset Mixed WM-38, achieving a high accuracy of 98.70%.

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Publication Details

Journal
Micromachines
Published
2024-10-17
DOI
https://doi.org/10.3390/mi15101265
Citations
2
Primary Topic
Industrial Vision Systems and Defect Detection
Type
article
Field-Weighted Citation Impact
0.70
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article

LDF-BNN: A Real-Time and High-Accuracy Binary Neural Network Accelerator Based on the Improved BNext

Rui Cen, Rui Wan, Dezheng Zhang, Dong Wang
2 citations
Micromachines
Industrial Vision Systems and Defect Detection
0.70
article

LDF-BNN: A Real-Time and High-Accuracy Binary Neural Network Accelerator Based on the Improved BNext

Rui Cen, Rui Wan, Dezheng Zhang, Dong Wang
article en
2 citations

Abstract

Significant progress has been made in industrial defect detection due to the powerful feature extraction capabilities of deep neural networks (DNNs). However, the high computational cost and memory requirement of DNNs pose a great challenge to the deployment of industrial edge-side devices. Although traditional binary neural networks (BNNs) have the advantages of small storage space requirements, high parallel computing capability, and low power consumption, the problem of significant accuracy degradation cannot be ignored. To tackle these challenges, this paper constructs a BNN with layered data fusion mechanism (LDF-BNN) based on BNext. By introducing the above mechanism, it strives to minimize the bandwidth pressure while reducing the loss of accuracy. Furthermore, we have designed an efficient hardware accelerator architecture based on this mechanism, enhancing the performance of high-accuracy BNN models with complex network structures. Additionally, the introduction of multi-storage parallelism alleviates the limitations imposed by the internal transfer rate, thus improving the overall computational efficiency. The experimental results show that our proposed LDF-BNN outperforms other methods in the comprehensive comparison, achieving a high accuracy of 72.23%, an image processing rate of 72.6 frames per second (FPS), and 1826 giga operations per second (GOPs) on the ImageNet dataset. Meanwhile, LDF-BNN can also be well applied to defect detection dataset Mixed WM-38, achieving a high accuracy of 98.70%.

MicromachinesVol. 15(10)
Beijing Jiaotong University (CN)
Affordable and clean energy
Openalex Percentile: Top 25%
Industrial Vision Systems and Defect Detection
0.70
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LDF-BNN: A Real-Time and High-Accuracy Binary Neural Network Accelerator Based on the Improved BNext — Rui Cen, Rui Wan, et al. · Micromachines (2024) | TGRS Research Map | TGRS