Surface polarization profile of ferroelectric thin films probed by X-ray standing waves and photoelectron spectroscopy

Abstract Understanding the mechanisms underlying a stable polarization at the surface of ferroelectric thin films is of particular importance both from a fundamental point of view and to achieve control of the surface polarization itself. In this study, we demonstrate that the X-ray standing wave technique allows the surface polarization profile of a ferroelectric thin film, as opposed to the average film polarity, to be probed directly. The X-ray standing wave technique provides the average Ti and Ba atomic positions, along the out-of-plane direction, near the surface of three differently strained $$\mathrm {BaTiO_3}$$ thin films. This technique gives direct access to the local ferroelectric polarization at and below the surface. By employing X-ray photoelectron spectroscopy, a detailed overview of the oxygen-containing species adsorbed on the surface is obtained. The different amplitude and orientation of the local ferroelectric polarizations are associated with surface charges attributed to different type, amount and spatial distribution of the oxygen-containing adsorbates.

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Publication Details

Journal
Scientific Reports
Published
2024-10-16
DOI
https://doi.org/10.1038/s41598-024-72805-1
Citations
1
Primary Topic
Ferroelectric and Piezoelectric Materials
Type
article
Field-Weighted Citation Impact
0.12

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article

Surface polarization profile of ferroelectric thin films probed by X-ray standing waves and photoelectron spectroscopy

Kai Roßnagel, Tien‐Lin Lee, David Pesquera, Andreas Scherz et al.
1 citations
Scientific Reports
Ferroelectric and Piezoelectric Materials
0.12
article

Surface polarization profile of ferroelectric thin films probed by X-ray standing waves and photoelectron spectroscopy

Kai Roßnagel, Tien‐Lin Lee, David Pesquera, Andreas Scherz, Gustau Catalán, Irena Spasojević, Giuseppe Mercurio, J. Zegenhagen, Le Phuong Hoang, Ivan A. Vartanyants
article en
1 citations

Abstract

Abstract Understanding the mechanisms underlying a stable polarization at the surface of ferroelectric thin films is of particular importance both from a fundamental point of view and to achieve control of the surface polarization itself. In this study, we demonstrate that the X-ray standing wave technique allows the surface polarization profile of a ferroelectric thin film, as opposed to the average film polarity, to be probed directly. The X-ray standing wave technique provides the average Ti and Ba atomic positions, along the out-of-plane direction, near the surface of three differently strained $$\mathrm {BaTiO_3}$$ thin films. This technique gives direct access to the local ferroelectric polarization at and below the surface. By employing X-ray photoelectron spectroscopy, a detailed overview of the oxygen-containing species adsorbed on the surface is obtained. The different amplitude and orientation of the local ferroelectric polarizations are associated with surface charges attributed to different type, amount and spatial distribution of the oxygen-containing adsorbates.

Scientific ReportsVol. 14(1)
Institució Catalana de Recerca i Estudis Avançats (ES), Universitat Autònoma de Barcelona (ES), Deutsches Elektronen-Synchrotron DESY (DE), Diamond Light Source (GB), Hochschule für Angewandte Wissenschaften Kiel (DE), Christian-Albrechts-Universität zu Kiel (DE), Institut Català de Nanociència i Nanotecnologia (ES), Max Planck Institute for the Structure and Dynamics of Matter (DE), European X-Ray Free-Electron Laser (DE)
Diamond Light Source, Centres de Recerca de Catalunya, Institut Català de Nanociència i Nanotecnologia, Generalitat de Catalunya, Ministerio de Ciencia e Innovación, Agencia Estatal de Investigación
Openalex Percentile: Top 59%
Ferroelectric and Piezoelectric Materials
0.12
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