High-temperature ADC peripheral circuit design and system performance testing

To validate the conversion performance of ADC at different temperatures, the demand for components in wide-temperature application systems is addressed by selecting high-reliability system components. This ensures stable operation of the analog-to-digital converter module across various temperatures, particularly in high-temperature environments. To achieve high-precision analog-to-digital conversion in wide-temperature environments, the ADC peripheral driving circuit is designed and optimized to guarantee signal acquisition accuracy, stability, and immunity to interference. In the experimental section, a high-temperature ADC performance testing system is constructed based on this analog-to-digital conversion module. The dynamic performance of the 12-bit ADC is evaluated using FFT spectrum analysis. Experimental results demonstrate that the effective number of bits of the ADC exceeds 10 bit within the temperature range of -40°C to 250°C, indicating excellent conversion performance of the ADC and high reliability of the peripheral circuit. Implementation of the high-temperature ADC performance testing system also provides valuable reference for constructing signal acquisition systems based on high-temperature ADC in practical high-temperature application scenarios.