Determination of the conduction and valence band offsets at the Co3O4/3C-SiC p-n heterojunction
The band offsets of semiconductor heterojunctions are critical parameters for the design of electronic and optoelectronic devices. In this work, we report the fabrication of a Co3O4/3C-SiC p-n heterojunction and the determination of the conduction band and valence band offsets at the Co3O4/3C-SiC heterojunction. Our results reveal that the Co3O4/3C-SiC p-n heterojunction exhibits a type-II band alignment, with a conduction band offset of 0.75 eV and a valence band offset of 0.96 eV. These experimental findings are crucial for the design and development of 3C-SiC devices for electronic and optoelectronic applications.
Authors
- Hui Zeng (ORCID: https://orcid.org/0000-0002-5565-6520)
- Vanya Darakchieva (ORCID: https://orcid.org/0000-0002-8112-7411)
- Weimin Wang (ORCID: https://orcid.org/0000-0002-1036-070X)
- Jianwu Sun (ORCID: https://orcid.org/0000-0002-6403-3720)
- Ivan G. Ivanov (ORCID: https://orcid.org/0000-0003-1000-0437)
Institutions
- Linköping University (SE)
- Lund University (SE)
- MAX IV Laboratory (SE)
Publication Details
- Journal
- Applied Physics Letters
- Published
- 2024-10-14
- DOI
- https://doi.org/10.1063/5.0226900
- Citations
- 2
- Primary Topic
- Silicon Carbide Semiconductor Technologies
- Type
- article
- Field-Weighted Citation Impact
- 0.42
Funders
- Swedish Foundation for International Cooperation in Research and Higher Education