Analysis of silver metal with a Thermo Scientific K-Alpha XPS instrument at 50 and 200 eV pass energies

Silver metal was analyzed by x-ray photoelectron spectroscopy using a Thermo Scientific K-Alpha instrument with an Al Kα x-ray source (1486.6 eV). The silver survey spectrum and high-resolution Ag 3d, Ag M4N45N45, Ag M5N45N45, Ag 3p, O 1s, C 1s, Ar 2p, Ag 4p, and Ag 4s narrow scans were obtained. The sample analyzed is the standard instrument calibration silver foil mounted inside the analysis chamber of the K-Alpha. Sputtering with monoatomic Ar+ was performed prior to analysis to remove surface contamination. Narrow and survey scans were collected at 50 and 200 eV pass energy, respectively.

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Publication Details

Journal
Surface Science Spectra
Published
2024-10-14
DOI
https://doi.org/10.1116/6.0003738
Citations
4
Primary Topic
Electron and X-Ray Spectroscopy Techniques
Type
article
Field-Weighted Citation Impact
0.71
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article

Analysis of silver metal with a Thermo Scientific K-Alpha XPS instrument at 50 and 200 eV pass energies

Matthew R. Linford, George H. Major, A. Dean, Samira Jafari et al.
4 citations
Surface Science Spectra
Electron and X-Ray Spectroscopy Techniques
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article

Analysis of silver metal with a Thermo Scientific K-Alpha XPS instrument at 50 and 200 eV pass energies

Matthew R. Linford, George H. Major, A. Dean, Samira Jafari, S.H. Ko, Braxton J. Kulbacki
article en
4 citations

Abstract

Silver metal was analyzed by x-ray photoelectron spectroscopy using a Thermo Scientific K-Alpha instrument with an Al Kα x-ray source (1486.6 eV). The silver survey spectrum and high-resolution Ag 3d, Ag M4N45N45, Ag M5N45N45, Ag 3p, O 1s, C 1s, Ar 2p, Ag 4p, and Ag 4s narrow scans were obtained. The sample analyzed is the standard instrument calibration silver foil mounted inside the analysis chamber of the K-Alpha. Sputtering with monoatomic Ar+ was performed prior to analysis to remove surface contamination. Narrow and survey scans were collected at 50 and 200 eV pass energy, respectively.

Surface Science SpectraVol. 31(2)
Brigham Young University (US), Texas Instruments (United States) (US)
Affordable and clean energy
Openalex Percentile: Top 33%
Electron and X-Ray Spectroscopy Techniques
0.71
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