Displacement Damage Effects on a CDTI-Based CCD-on-CMOS: Dark Current and Charge Transfer Inefficiency
Displacement damage effects induced by proton and neutron irradiation are explored in a capacitive deep trench charge coupled device (CCD)-on-CMOS image sensor. Dark current and charge transfer inefficiency (CTI) are investigated to exhibit, respectively, the generation and capture-emission mechanisms arising with defect clusters and point defects introduction. This article reports the trends in damage factor, trap production rate, trap cross section, and energy distribution with respect to particle fluence and annealing. CTI mitigation techniques based on the temperature and clocking of operation are discussed.
Authors
- Aubin Antonsanti (ORCID: https://orcid.org/0000-0003-1889-2759)
- Alexandre Le Roch (ORCID: https://orcid.org/0000-0002-2579-800X)
- Vincent Goiffon (ORCID: https://orcid.org/0000-0001-5024-0115)
- Antoine Salih Alj (ORCID: https://orcid.org/0000-0002-9435-8438)
- Pierre Magnan (ORCID: https://orcid.org/0000-0003-3122-7163)
- S. Demiguel (ORCID: https://orcid.org/0009-0008-6099-4672)
- F. Roy (ORCID: https://orcid.org/0000-0003-1992-8477)
- Cédric Virmontois (ORCID: https://orcid.org/0000-0002-9348-1565)
- Pierre Touron (ORCID: https://orcid.org/0000-0003-3254-5622)
- Valérian Lalucaa (ORCID: https://orcid.org/0000-0003-4083-5363)
- Julien Michelot (ORCID: https://orcid.org/0000-0001-7212-983X)
- Arnaud Tournier
Institutions
- Institut Superieur de l'Aeronautique et de l'Espace (ISAE-SUPAERO) (FR)
- Centre National d'Études Spatiales (FR)
- STMicroelectronics (France) (FR)
- Thales (France) (FR)
- Centre Hospitalier de Cannes (FR)
- Thales Alenia Space (France)
Publication Details
- Journal
- IEEE Transactions on Nuclear Science
- Published
- 2024-10-14
- DOI
- https://doi.org/10.1109/tns.2024.3480281
- Citations
- 1
- Primary Topic
- CCD and CMOS Imaging Sensors
- Type
- article
- Field-Weighted Citation Impact
- 0.21