The Influence of Mechanical Cyclic Bending Stress on the Reliability of the Emerging DDR5 Memories in the Industrial Market
The increased demand for electronic products that meet technological requirements has driven the successful adoption of DDR5 technology. This new generation of memory stands out for its data transfer bandwidth, capacity, and speed, surpassing its predecessor, the DDR4. Despite the improvements offered by DDR5 compared to its older generations, it is crucial to evaluate its performance, reliability, and qualifications by themselves. Special attention must be paid to the mechanical stress that the printed circuit board (PCB) may face during production or in operation, as this can impact the stability of the system and the integrity of the soldered electronic components. In this context, this article reports the performance and reliability of DDR5 UDIMM memory modules with densities of 8, 16, and 32 GB, when subjected to bending tests. The international norms JESD22-B113 and IPC-A 610 J-2024 are used as the main reference for this test. Furthermore, the influence of this mechanical stress on data integrity, system stability, and possible short-circuit risks was examined through functional tests, x-ray imaging, tomography, and cross sections analysis. The obtained results provided insights into the qualification practices aimed at the industrial market, serving as a comprehensive guide for this emerging technology. The three densities of DDR5 memory presented strong indications of high quality and high reliability, whereas they maintained data integrity and system stability after being subjected to mechanical bending stress, suggesting those products as a good candidate for high-performance applications.
Authors
- Gabrielle Machado dos Santos (ORCID: https://orcid.org/0000-0002-1142-7398)
- Andrea Guarino
- Tatiany Mafra da Silva (ORCID: https://orcid.org/0000-0002-9672-565X)
- Geilson Loureiro (ORCID: https://orcid.org/0000-0002-9572-177X)
- L.A.L. Basilio (ORCID: https://orcid.org/0000-0002-2414-432X)
- Lorena Soares Bezerra
Institutions
- Instituto Nacional de Pesquisas da Amazônia (BR)
Publication Details
- Journal
- IEEE Transactions on Components Packaging and Manufacturing Technology
- Published
- 2024-10-14
- DOI
- https://doi.org/10.1109/tcpmt.2024.3479928
- Primary Topic
- Integrated Circuits and Semiconductor Failure Analysis
- Type
- article
- Field-Weighted Citation Impact
- 0.00