Morphological and structural properties of antimony selenide thin films deposited with external electric field assistance
A method for producing a thin semiconductor film of antimony selenide (Sb2Se3) via vacuum thermal evaporation with the assistance of an electric field was presented. The morphological, elemental and structural properties of the thin films were characterized using X-ray diffraction and scanning electron microscopy (with energy dispersive X-ray spectroscopy). It was found that an applied constant electric field plays an important role in obtaining Sb2Se3 thin films with the desired morphological and structural properties. The latter is a useful tool for controlling charge transport properties in thin films.
Authors
- A. Olimov (ORCID: https://orcid.org/0000-0002-6580-526X)
- Urol Kudratovich Makhmanov (ORCID: https://orcid.org/0000-0002-7185-2812)
- К. M. Kuchkarov (ORCID: https://orcid.org/0000-0002-2238-7205)
- M. A. Makhmudov (ORCID: https://orcid.org/0000-0001-7627-4890)
- T.M. Razykov (ORCID: https://orcid.org/0000-0001-9738-3308)
- А. Х. Шукуров (ORCID: https://orcid.org/0000-0002-0582-5453)
Institutions
- Academy of Sciences Republic of Uzbekistan (UZ)
- Institute of Ion Plasma Laser Technologies (UZ)
- National University of Uzbekistan (UZ)
Publication Details
- Journal
- «Узбекский физический журнал»
- Published
- 2024-10-13
- DOI
- https://doi.org/10.52304/.v26i3.537
- Primary Topic
- Chalcogenide Semiconductor Thin Films
- Type
- article
- Field-Weighted Citation Impact
- 0.00