Quantitative analysis of phase retrieval with the transport of intensity equation under low-light conditions

We demonstrate low-light quantitative phase imaging using the transport of intensity equation. The incident numbers of photons are experimentally determined using an optical power meter. Although the low-light phase imaging condition is vulnerable to noise, its application in astronomy and imaging of biological samples draws the attention of researchers. Low light is treated as a Poisson noise. We explore the method as an opportunity to study low-light phase imaging conditions and the possible potential to go toward ultra-low-light conditions. We have illustrated the same with the help of numerical simulation and experimental results.

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Publication Details

Journal
Optical Engineering
Published
2024-10-12
DOI
https://doi.org/10.1117/1.oe.63.11.111813
Citations
3
Primary Topic
Advanced X-ray Imaging Techniques
Type
article
Field-Weighted Citation Impact
1.82
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article

Quantitative analysis of phase retrieval with the transport of intensity equation under low-light conditions

Alok Gupta, Naveen K. Nishchal, Ram Kumar
3 citations
Optical Engineering
Advanced X-ray Imaging Techniques
1.82
article

Quantitative analysis of phase retrieval with the transport of intensity equation under low-light conditions

Alok Gupta, Naveen K. Nishchal, Ram Kumar
article en
3 citations

Abstract

We demonstrate low-light quantitative phase imaging using the transport of intensity equation. The incident numbers of photons are experimentally determined using an optical power meter. Although the low-light phase imaging condition is vulnerable to noise, its application in astronomy and imaging of biological samples draws the attention of researchers. Low light is treated as a Poisson noise. We explore the method as an opportunity to study low-light phase imaging conditions and the possible potential to go toward ultra-low-light conditions. We have illustrated the same with the help of numerical simulation and experimental results.

Optical EngineeringVol. 63(11)
Indian Institute of Technology Patna (IN)
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Openalex Percentile: Top 15%
Advanced X-ray Imaging Techniques
1.82
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