The reference window for reduced perturbation of the reference wave in electrical biasing off-axis electron holography

The perturbation of the reference wave due to electric stray fields represents a major challenge in quantitative electron holographic investigations. By introducing a focused-ion-beam-milled rectangular hole, the reference window, in an area of nearly constant electrostatic potential of the sample, this perturbation can be significantly reduced. The edge of the window forms a closed conducting loop, acting similarly to a Faraday cage, shielding the influence of the stray field on the reference wave to some extent. In this work, the shielding effect of the reference window is systematically investigated by comparing electron holograms of an electrically biased coplanar capacitor, as a well-known reference sample, with finite element simulations. It is shown that the introduction of the reference window into electrical biasing samples both suppresses unknown lateral phase distortions substantially and in addition improves the agreement of the experimentally observed phase slope with that expected by simulation significantly, particularly for small object-reference wave distances. Consequently, a slight adjustment of the sample geometry results in an improved reproducibility of electron holographic electrical biasing experiments, which is a significant step towards quantitative evaluation.

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Publication Details

Journal
Ultramicroscopy
Published
2024-10-11
DOI
https://doi.org/10.1016/j.ultramic.2024.114060
Citations
3
Primary Topic
Advanced Electron Microscopy Techniques and Applications
Type
article
Field-Weighted Citation Impact
1.57
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article

The reference window for reduced perturbation of the reference wave in electrical biasing off-axis electron holography

Christoph T. Koch, C. Günther, Hüseyin Çelik, Tolga Wagner et al.
3 citations
Ultramicroscopy
Advanced Electron Microscopy Techniques and Applications
1.57
article

The reference window for reduced perturbation of the reference wave in electrical biasing off-axis electron holography

Christoph T. Koch, C. Günther, Hüseyin Çelik, Tolga Wagner, Dirk Berger, Michael Lehmann, Robin Kraft, Franz Nowak
article en
3 citations

Abstract

The perturbation of the reference wave due to electric stray fields represents a major challenge in quantitative electron holographic investigations. By introducing a focused-ion-beam-milled rectangular hole, the reference window, in an area of nearly constant electrostatic potential of the sample, this perturbation can be significantly reduced. The edge of the window forms a closed conducting loop, acting similarly to a Faraday cage, shielding the influence of the stray field on the reference wave to some extent. In this work, the shielding effect of the reference window is systematically investigated by comparing electron holograms of an electrically biased coplanar capacitor, as a well-known reference sample, with finite element simulations. It is shown that the introduction of the reference window into electrical biasing samples both suppresses unknown lateral phase distortions substantially and in addition improves the agreement of the experimentally observed phase slope with that expected by simulation significantly, particularly for small object-reference wave distances. Consequently, a slight adjustment of the sample geometry results in an improved reproducibility of electron holographic electrical biasing experiments, which is a significant step towards quantitative evaluation.

UltramicroscopyVol. 267
Humboldt-Universität zu Berlin (DE), Institute for Biomedical Engineering (CH), Technische Universität Berlin (DE)
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Openalex Percentile: Top 12%
Advanced Electron Microscopy Techniques and Applications
1.57
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The reference window for reduced perturbation of the reference wave in electrical biasing off-axis electron holography — Christoph T. Koch, C. Günther, et al. · Ultramicroscopy (2024) | TGRS Research Map | TGRS