Off-Road Autonomy Validation Using Scalable Digital Twin Simulations Within High-Performance Computing Clusters
<div class="section abstract"> <div class="htmlview paragraph">Off-road autonomy validation presents unique challenges due to the unpredictable and dynamic nature of off-road environments. Variability analyses, by sequentially sweeping across the parameter space, struggle to comprehensively assess the performance of off-road autonomous systems within the imposed time constraints. This paper proposes leveraging scalable digital twin simulations within high-performance computing (HPC) clusters to address this challenge. By harnessing the computational power of HPC clusters, our approach aims to provide a scalable and efficient means to validate off-road autonomy algorithms, enabling rapid iteration and testing of autonomy algorithms under various conditions. We demonstrate the effectiveness of our framework through performance evaluations of the HPC cluster in terms of simulation parallelization and present the systematic variability analysis of a candidate off-road autonomy algorithm to identify potential vulnerabilities in the autonomy stack’s perception, planning and control modules.</div> </div>
Authors
- Mark Brudnak
- Chinmay Vilas Samak (ORCID: https://orcid.org/0000-0002-6455-6716)
- Jonathon M. Smereka (ORCID: https://orcid.org/0000-0001-9262-1143)
- Venkat Krovi (ORCID: https://orcid.org/0000-0003-2539-896X)
- Tanmay Vilas Samak (ORCID: https://orcid.org/0000-0002-9717-0764)
- David Gorsich
- Joey Binz
- Feng Luo (ORCID: https://orcid.org/0000-0002-1410-1705)
Institutions
- United States Department of the Army (US)
- United States Army Combat Capabilities Development Command (US)
- United States Army (US)
- U.S. Army Combat Capabilities Development Command Ground Vehicle System Center (US)
- Clemson University (US)
Publication Details
- Journal
- SAE technical papers on CD-ROM/SAE technical paper series
- Published
- 2024-09-16
- DOI
- https://doi.org/10.4271/2024-01-4111
- Primary Topic
- Radiation Effects in Electronics
- Type
- article
- Field-Weighted Citation Impact
- 0.00