LG = 50 nm T-gated and Fe-doped double quantum well GaN‒HEMT on SiC wafer with graded AlGaN barrier for future power electronics applications

In this work, high-performance L G = 50 nm graded double-channel (GDC)-HEMT featuring AlN top barrier, recessed T-gate and graded-AlGaN bottom barrier is designed and investigated. Two quantum-wells are formed in the AlN-GaN-graded AlGaN-GaN multilayer structure developed on a SiC substrate and the clear double hump feature of the transconductance (G M ), cut-off frequency (f T ), and capacitance plots clearly illustrates the double-channel (DC) behavior. The investigations carried out to explore the impact of barrier thickness (both AlN & graded-AlGaN) revealed superior performance with the G M showing two peaks at 181.5 & 488.1 mS/mm, the peak-drive-current (I D_peak ) with V GS biased at 3 V is 1.81 A/mm, maximum saturation drain current of 3.08 A/mm (V GS = 3V), and the f T derived from the left- and right-hump are 263.7 GHz & 354.2 GHz, respectively, when both barriers are 6 nm thin, attributable to enhanced 2DEG density due to the coordination of channels because of proximity and lower leakage. It has been noticed that when the bottom barrier is thick, the DC behaviour is less obvious due to insufficient gate access to the lower channel. By using various metals, this study also investigates how gate engineering affects the electrical characteristics of the GDC-HEMT. The lower ϕ m (work-function) of the Al-gate, led to better DC/RF performance. When the Schottky barrier rises as a result of the conduction band edge being elevated, the performance reduces, and the threshold voltage (V th ) increases. Since it is essential to comprehend the role that source resistance (R s ) & drain resistance (R d ) play in RF design, we have also conducted simulations by varying the source-gate gap (L GS ) & drain-gate gap (L GD ). Due to low R s & R d , it was determined that the GDC-HEMT performed better at the smallest L GS & L GD . The extraordinary performance strongly highlights the immense potential and applicability of the GDC-HEMTs for future broadband power amplifiers.

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Publication Details

Journal
Journal of Science Advanced Materials and Devices
Published
2024-10-11
DOI
https://doi.org/10.1016/j.jsamd.2024.100795
Citations
5
Primary Topic
GaN-based semiconductor devices and materials
Type
article
Field-Weighted Citation Impact
1.55
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article

LG = 50 nm T-gated and Fe-doped double quantum well GaN‒HEMT on SiC wafer with graded AlGaN barrier for future power electronics applications

Sandip Bhattacharya, D. Nirmal, Amit Krishna Dwivedi, B. Mounika et al.
5 citations
Journal of Science Advanced Materials and Devices
GaN-based semiconductor devices and materials
1.55
article

LG = 50 nm T-gated and Fe-doped double quantum well GaN‒HEMT on SiC wafer with graded AlGaN barrier for future power electronics applications

Sandip Bhattacharya, D. Nirmal, Amit Krishna Dwivedi, B. Mounika, J. Ajayan
article en
5 citations

Abstract

In this work, high-performance L G = 50 nm graded double-channel (GDC)-HEMT featuring AlN top barrier, recessed T-gate and graded-AlGaN bottom barrier is designed and investigated. Two quantum-wells are formed in the AlN-GaN-graded AlGaN-GaN multilayer structure developed on a SiC substrate and the clear double hump feature of the transconductance (G M ), cut-off frequency (f T ), and capacitance plots clearly illustrates the double-channel (DC) behavior. The investigations carried out to explore the impact of barrier thickness (both AlN & graded-AlGaN) revealed superior performance with the G M showing two peaks at 181.5 & 488.1 mS/mm, the peak-drive-current (I D_peak ) with V GS biased at 3 V is 1.81 A/mm, maximum saturation drain current of 3.08 A/mm (V GS = 3V), and the f T derived from the left- and right-hump are 263.7 GHz & 354.2 GHz, respectively, when both barriers are 6 nm thin, attributable to enhanced 2DEG density due to the coordination of channels because of proximity and lower leakage. It has been noticed that when the bottom barrier is thick, the DC behaviour is less obvious due to insufficient gate access to the lower channel. By using various metals, this study also investigates how gate engineering affects the electrical characteristics of the GDC-HEMT. The lower ϕ m (work-function) of the Al-gate, led to better DC/RF performance. When the Schottky barrier rises as a result of the conduction band edge being elevated, the performance reduces, and the threshold voltage (V th ) increases. Since it is essential to comprehend the role that source resistance (R s ) & drain resistance (R d ) play in RF design, we have also conducted simulations by varying the source-gate gap (L GS ) & drain-gate gap (L GD ). Due to low R s & R d , it was determined that the GDC-HEMT performed better at the smallest L GS & L GD . The extraordinary performance strongly highlights the immense potential and applicability of the GDC-HEMTs for future broadband power amplifiers.

Journal of Science Advanced Materials and DevicesVol. 9(4)
Karunya University (IN), University of Warwick (GB)
Affordable and clean energy
Openalex Percentile: Top 17%
GaN-based semiconductor devices and materials
1.55
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