Drift of Combinational Circuits Failure Rates with a Probabilistic Model Approximated by Partitioning
This paper addresses applications subject to stringent safety constraints. The study focuses on comparing two analytical models for assessing fault propagation in combinational circuits. The first model is exhaustive and exact. The second approximates the first one as it partitions netlists into sub circuits, that are separately analyzed with the first model. Thanks to the clustering approach, the second model is more scalable than the reference model. We demonstrate through analytical arguments and experimental results that the approximating model is not optimistic compared to the reference probability values. The experimental comparisons also show that the results of the second model remain close to the reference ones.
Authors
- G. S. Gutemberg (ORCID: https://orcid.org/0000-0002-0300-4520)
- Lírida Naviner (ORCID: https://orcid.org/0000-0002-6320-4153)
- Esther Goudet (ORCID: https://orcid.org/0009-0008-8591-9783)
- Fabio Sureau
- Sayah El Hajji
- Philippe Roché
- Luis Trevino
- Jean-Marc Daveau
Institutions
- Centre National de la Recherche Scientifique (FR)
- Universidade Federal de Campina Grande (BR)
- STMicroelectronics (France) (FR)
- Institut Polytechnique de Paris (FR)
- Laboratoire Traitement et Communication de l’Information (FR)
- Université de Rennes (FR)
Publication Details
- Published
- 2024-09-02
- DOI
- https://doi.org/10.1109/sbcci62366.2024.10704004
- Primary Topic
- VLSI and Analog Circuit Testing
- Type
- article
- Field-Weighted Citation Impact
- 0.00